Fourier transform emission lifetime spectrometer

Leilei Peng, Jason T. Motz, Robert W. Redmond, Brett E. Bouma, Guillermo J. Tearney

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

We report a rapid and low cost Fourier transform spectrometer that uses a path length modulated Michelson interferometer to simultaneously measure excitation spectra and excitation wavelength-dependent emission lifetimes. Excitation spectra and lifetimes of excited tris(2,2′-bipyridyl) ruthenium(II) measured using this technique corresponded to values known in the literature. Excitation-dependent lifetimes of porous silicon measured with this technique suggest the influence of quantum confinement effects. This method may be useful for measuring mixtures of emitting species with closely spaced lifetimes as well as studying excitation wavelength-dependent emission phenomena.

Original languageEnglish (US)
Pages (from-to)421-423
Number of pages3
JournalOptics letters
Volume32
Issue number4
DOIs
StatePublished - Feb 15 2007
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Peng, L., Motz, J. T., Redmond, R. W., Bouma, B. E., & Tearney, G. J. (2007). Fourier transform emission lifetime spectrometer. Optics letters, 32(4), 421-423. https://doi.org/10.1364/OL.32.000421