Freeform surface characterization and instrument alignment for freeform space applications

Manal Khreishi, Raymond Ohl, Joseph Howard, Jonathan Papa, Clark Hovis, Andrew Howe, Theodore Hadjimichael, Patrick Thompson, Ron Shiri, Garrett West, Adam Phenis, Rongguang Liang

Research output: Chapter in Book/Report/Conference proceedingConference contribution


CMM metrology provides simple, 3D surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

Original languageEnglish (US)
Title of host publicationFreeform Optics, Freeform 2019
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
StatePublished - 2019
EventFreeform Optics, Freeform 2019 - Washington, United States
Duration: Jun 10 2019Jun 12 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F173-Freeform 2019


ConferenceFreeform Optics, Freeform 2019
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


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