Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells

Paul D. Piehowski, Michael E. Kurczy, David Willingham, Shawn Parry, Michael L Heien, Nicholas Winograd, Andrew G. Ewing

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

Freeze-etching, the practice of removing excess surface water from a sample through sublimation into the vacuum of the analysis environment, has been extensively used in conjunction with electron microscopy. Here, we apply this technique to time-of-flight secondary-ion mass spectrometry (ToF-SIMS) imaging of cryogenically preserved single cells. By removing the excess water which condenses onto the sample in vacuo, a uniform surface is produced that is ideal for imaging by static SIMS. We demonstrate that the conditions employed to remove deposited water do not adversely affect cell morphology and do not redistribute molecules in the topmost surface layers. In addition, we found water can be controllably redeposited onto the sample at temperatures below -100 °C in vacuum. The redeposited water increases the ionization of characteristic fragments of biologically interesting molecules 2-fold without loss of spatial resolution. The utilization of freeze-etch methodology will increase the reliability of cryogenic sample preparations for SIMS analysis by providing greater control of the surface environment. Using these procedures, we have obtained high quality spectra with both atomic bombardment as well as C60+ cluster ion bombardment.

Original languageEnglish (US)
Pages (from-to)7906-7911
Number of pages6
JournalLangmuir
Volume24
Issue number15
DOIs
StatePublished - Aug 5 2008
Externally publishedYes

Fingerprint

Secondary ion mass spectrometry
secondary ion mass spectrometry
Etching
Vapors
etching
vapors
Imaging techniques
Water
matrices
cells
water
bombardment
Vacuum
vacuum
Molecules
Sublimation
Ion bombardment
surface water
sublimation
Surface waters

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Piehowski, P. D., Kurczy, M. E., Willingham, D., Parry, S., Heien, M. L., Winograd, N., & Ewing, A. G. (2008). Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells. Langmuir, 24(15), 7906-7911. https://doi.org/10.1021/la800292e

Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells. / Piehowski, Paul D.; Kurczy, Michael E.; Willingham, David; Parry, Shawn; Heien, Michael L; Winograd, Nicholas; Ewing, Andrew G.

In: Langmuir, Vol. 24, No. 15, 05.08.2008, p. 7906-7911.

Research output: Contribution to journalArticle

Piehowski, PD, Kurczy, ME, Willingham, D, Parry, S, Heien, ML, Winograd, N & Ewing, AG 2008, 'Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells', Langmuir, vol. 24, no. 15, pp. 7906-7911. https://doi.org/10.1021/la800292e
Piehowski PD, Kurczy ME, Willingham D, Parry S, Heien ML, Winograd N et al. Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells. Langmuir. 2008 Aug 5;24(15):7906-7911. https://doi.org/10.1021/la800292e
Piehowski, Paul D. ; Kurczy, Michael E. ; Willingham, David ; Parry, Shawn ; Heien, Michael L ; Winograd, Nicholas ; Ewing, Andrew G. / Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells. In: Langmuir. 2008 ; Vol. 24, No. 15. pp. 7906-7911.
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