Fully microscopic studies of strong-field atom ionization

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationLaser Science, LS 2014
PublisherOptical Society of America (OSA)
ISBN (Print)1557522863
StatePublished - Oct 14 2014
EventLaser Science, LS 2014 - Tucson, United States
Duration: Oct 19 2014Oct 23 2014

Other

OtherLaser Science, LS 2014
CountryUnited States
CityTucson
Period10/19/1410/23/14

Fingerprint

Ionization
Atoms

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Schuh, K., Hader, J., Moloney, J. V., & Koch, S. W. (2014). Fully microscopic studies of strong-field atom ionization. In Laser Science, LS 2014 Optical Society of America (OSA).

Fully microscopic studies of strong-field atom ionization. / Schuh, K.; Hader, Jorg; Moloney, Jerome V; Koch, Stephan W.

Laser Science, LS 2014. Optical Society of America (OSA), 2014.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Schuh, K, Hader, J, Moloney, JV & Koch, SW 2014, Fully microscopic studies of strong-field atom ionization. in Laser Science, LS 2014. Optical Society of America (OSA), Laser Science, LS 2014, Tucson, United States, 10/19/14.
Schuh K, Hader J, Moloney JV, Koch SW. Fully microscopic studies of strong-field atom ionization. In Laser Science, LS 2014. Optical Society of America (OSA). 2014
Schuh, K. ; Hader, Jorg ; Moloney, Jerome V ; Koch, Stephan W. / Fully microscopic studies of strong-field atom ionization. Laser Science, LS 2014. Optical Society of America (OSA), 2014.
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