Fundamental performance differences between CMOS and CCD imagers; Part II

James Janesick, James Andrews, John Tower, Mark Grygon, Tom Elliott, John Cheng, Michael P Lesser, Jeff Pinter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

A new class of CMOS imagers that compete with scientific CCDs is presented. The sensors are based on deep depletion backside illuminated technology to achieve high near infrared quantum efficiency and low pixel cross-talk. The imagers deliver very low read noise suitable for single photon counting - Fano-noise limited soft x-ray applications. Digital correlated double sampling signal processing necessary to achieve low read noise performance is analyzed and demonstrated for CMOS use. Detailed experimental data products generated by different pixel architectures (notably 3TPPD, 5TPPD and 6TPG designs) are presented including read noise, charge capacity, dynamic range, quantum efficiency, charge collection and transfer efficiency and dark current generation. Radiation damage data taken for the imagers is also reported.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6690
DOIs
StatePublished - 2007
EventFocal Plane Arrays for Space Telescopes III - San Diego, CA, United States
Duration: Aug 27 2007Aug 28 2007

Other

OtherFocal Plane Arrays for Space Telescopes III
CountryUnited States
CitySan Diego, CA
Period8/27/078/28/07

Fingerprint

Charge coupled devices
Image sensors
charge coupled devices
CMOS
Quantum efficiency
Pixels
quantum efficiency
Dark currents
pixels
Radiation damage
data products
Signal processing
Photons
dark current
radiation damage
Sampling
Infrared radiation
dynamic range
signal processing
X rays

Keywords

  • Backside illumination
  • CMOS and CCD imagers
  • Deep depletion
  • Fano- Noise
  • Radiation damage
  • X-ray

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Janesick, J., Andrews, J., Tower, J., Grygon, M., Elliott, T., Cheng, J., ... Pinter, J. (2007). Fundamental performance differences between CMOS and CCD imagers; Part II. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6690). [669003] https://doi.org/10.1117/12.740218

Fundamental performance differences between CMOS and CCD imagers; Part II. / Janesick, James; Andrews, James; Tower, John; Grygon, Mark; Elliott, Tom; Cheng, John; Lesser, Michael P; Pinter, Jeff.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6690 2007. 669003.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Janesick, J, Andrews, J, Tower, J, Grygon, M, Elliott, T, Cheng, J, Lesser, MP & Pinter, J 2007, Fundamental performance differences between CMOS and CCD imagers; Part II. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6690, 669003, Focal Plane Arrays for Space Telescopes III, San Diego, CA, United States, 8/27/07. https://doi.org/10.1117/12.740218
Janesick J, Andrews J, Tower J, Grygon M, Elliott T, Cheng J et al. Fundamental performance differences between CMOS and CCD imagers; Part II. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6690. 2007. 669003 https://doi.org/10.1117/12.740218
Janesick, James ; Andrews, James ; Tower, John ; Grygon, Mark ; Elliott, Tom ; Cheng, John ; Lesser, Michael P ; Pinter, Jeff. / Fundamental performance differences between CMOS and CCD imagers; Part II. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6690 2007.
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