Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs

Patrick Ingraham, Jean Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, Vincent Fesquet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

The newly commissioned Gemini Planet Imager (GPI) combines extreme adaptive optics, an advanced coronagraph, precision wavefront control and a lenslet-based integral field spectrograph (IFS) to measure the spectra of young extrasolar giant planets between 0.9-2.5 μm. Each GPI detector image, when in spectral model, consists of ∼37,000 microspectra which are under or critically sampled in the spatial direction. This paper demonstrates how to obtain high-resolution microlens PSFs and discusses their use in enhancing the wavelength calibration, flexure compensation and spectral extraction. This method is generally applicable to any lenslet-based integral field spectrograph including proposed future instrument concepts for space missions.

Original languageEnglish (US)
Title of host publicationGround-Based and Airborne Instrumentation for Astronomy V
EditorsSuzanne K. Ramsay, Ian S. McLean, Hideki Takami
PublisherSPIE
ISBN (Electronic)9780819496157
DOIs
StatePublished - 2014
Externally publishedYes
EventGround-Based and Airborne Instrumentation for Astronomy V - Montreal, Canada
Duration: Jun 22 2014Jun 26 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9147
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherGround-Based and Airborne Instrumentation for Astronomy V
Country/TerritoryCanada
CityMontreal
Period6/22/146/26/14

Keywords

  • data reduction
  • Extrasolar planets
  • High Contrast Imaging
  • Infrared Detectors
  • Integral field spectrograph

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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