Grating-slit: An unusual optical surface test

Chao Wen Liang, Jose M Sasian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557528187, 9781557528186
StatePublished - 2006
EventOptical Fabrication and Testing, OFT 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Other

OtherOptical Fabrication and Testing, OFT 2006
CountryUnited States
CityRochester, NY
Period10/10/0610/10/06

Fingerprint

Aberrations
slits
Light sources
aberration
rays
light sources
chips
gratings

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Liang, C. W., & Sasian, J. M. (2006). Grating-slit: An unusual optical surface test. In Optics InfoBase Conference Papers Optical Society of America.

Grating-slit : An unusual optical surface test. / Liang, Chao Wen; Sasian, Jose M.

Optics InfoBase Conference Papers. Optical Society of America, 2006.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Liang, CW & Sasian, JM 2006, Grating-slit: An unusual optical surface test. in Optics InfoBase Conference Papers. Optical Society of America, Optical Fabrication and Testing, OFT 2006, Rochester, NY, United States, 10/10/06.
Liang CW, Sasian JM. Grating-slit: An unusual optical surface test. In Optics InfoBase Conference Papers. Optical Society of America. 2006
Liang, Chao Wen ; Sasian, Jose M. / Grating-slit : An unusual optical surface test. Optics InfoBase Conference Papers. Optical Society of America, 2006.
@inproceedings{faa8f382e7b84446811071abc7e39475,
title = "Grating-slit: An unusual optical surface test",
abstract = "This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.",
author = "Liang, {Chao Wen} and Sasian, {Jose M}",
year = "2006",
language = "English (US)",
isbn = "1557528187",
booktitle = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America",

}

TY - GEN

T1 - Grating-slit

T2 - An unusual optical surface test

AU - Liang, Chao Wen

AU - Sasian, Jose M

PY - 2006

Y1 - 2006

N2 - This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

AB - This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

UR - http://www.scopus.com/inward/record.url?scp=84899141237&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899141237&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84899141237

SN - 1557528187

SN - 9781557528186

BT - Optics InfoBase Conference Papers

PB - Optical Society of America

ER -