Grating-slit: An unusual optical surface test

Chao Wen Liang, Jose Sasian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

Original languageEnglish (US)
Title of host publicationOptical Fabrication and Testing, OFT 2006
PublisherOptical Society of America
ISBN (Print)1557528187, 9781557528186
StatePublished - Jan 1 2006
EventOptical Fabrication and Testing, OFT 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Fabrication and Testing, OFT 2006
CountryUnited States
CityRochester, NY
Period10/10/0610/10/06

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Liang, C. W., & Sasian, J. (2006). Grating-slit: An unusual optical surface test. In Optical Fabrication and Testing, OFT 2006 (Optics InfoBase Conference Papers). Optical Society of America.