High frequency characterization of carbon nanotube films

Ziran Wu, Lu Wang, Hao Xin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Carbon nanotube films are characterized using Vector Network Analyzer (VNA) and Terahertz Time-Domain Spectroscopy (THz-TDS). Both transmission and reflection experiments are performed in order to measure the complex refractive index and the wave impedance. This method allows simultaneous extraction of both the permittivity and permeability without any assumptions. Experimental results are obtained from microwave to THz for various multi-walled and single-walled nanotube samples.

Original languageEnglish (US)
Title of host publication33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
DOIs
StatePublished - 2008
Event33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 - Pasadena, CA, United States
Duration: Sep 15 2008Sep 19 2008

Other

Other33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
CountryUnited States
CityPasadena, CA
Period9/15/089/19/08

Fingerprint

Electric network analyzers
Nanotubes
Carbon nanotubes
Refractive index
Permittivity
Microwaves
Spectroscopy
Experiments

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Wu, Z., Wang, L., & Xin, H. (2008). High frequency characterization of carbon nanotube films. In 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 [4665477] https://doi.org/10.1109/ICIMW.2008.4665477

High frequency characterization of carbon nanotube films. / Wu, Ziran; Wang, Lu; Xin, Hao.

33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008. 4665477.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wu, Z, Wang, L & Xin, H 2008, High frequency characterization of carbon nanotube films. in 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008., 4665477, 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008, Pasadena, CA, United States, 9/15/08. https://doi.org/10.1109/ICIMW.2008.4665477
Wu Z, Wang L, Xin H. High frequency characterization of carbon nanotube films. In 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008. 4665477 https://doi.org/10.1109/ICIMW.2008.4665477
Wu, Ziran ; Wang, Lu ; Xin, Hao. / High frequency characterization of carbon nanotube films. 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008.
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