High-resolution anamorphic SPECT imaging

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have developed a gamma-ray imaging system that combines a high-resolution silicon detector with two sets of movable, half-keel-edged copper-tungsten blades configured as crossed slits. These apertures can be positioned independently between the object and detector, producing an anamorphic image in which the axial and transaxial magnifications are not constrained to be equal. The detector is a 60 mm × 60mm, one-millimeter-thick, one-megapixel silicon double-sided strip detector with a strip pitch of 59μm. The flexible nature of this system allows the application of adaptive imaging techniques. We present system details; calibration, acquisition, and reconstruction methods; and imaging results.

Original languageEnglish (US)
Article number6818414
Pages (from-to)1126-1135
Number of pages10
JournalIEEE Transactions on Nuclear Science
Volume61
Issue number3
DOIs
StatePublished - 2014

Fingerprint

Detectors
Imaging techniques
high resolution
detectors
strip
Silicon detectors
keels
Gamma rays
Imaging systems
Tungsten
silicon
blades
magnification
imaging techniques
Calibration
Copper
slits
Silicon
acquisition
tungsten

Keywords

  • Adaptive
  • anamorphic imaging
  • crossed slits
  • double-sided strip detector
  • DSSD
  • low energy
  • silicon
  • small animal
  • SPECT

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

Cite this

High-resolution anamorphic SPECT imaging. / Durko, Heather L.; Barrett, Harrison H; Furenlid, Lars R.

In: IEEE Transactions on Nuclear Science, Vol. 61, No. 3, 6818414, 2014, p. 1126-1135.

Research output: Contribution to journalArticle

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