High resolution heterodyne interferometer without detectable periodic nonlinearity

Ki Nam Joo; Jonathan D. Ellis; Eric S. Buice; Jo W. Spronck; Robert H.Munnig Schmidt

doi:10.1364/OE.18.001159

High resolution heterodyne interferometer without detectable periodic nonlinearity

Ki Nam Joo, Jonathan D. Ellis, Eric S. Buice, Jo W. Spronck, Robert H.Munnig Schmidt

Research output: Contribution to journal › Article › peer-review

82 Scopus citations

Abstract

A high resolution heterodyne laser interferometer without periodic nonlinearity for linear displacement measurements is described. It uses two spatially separated beams with an offset frequency and an interferometer configuration which has no mixed states to prevent polarization mixing. In this research, a simple interferometer configuration for both retroreflector and plane mirror targets which are both applicable to industrial applications was developed. Experimental results show there is no detectable periodic nonlinearity for both of the retro-reflector interferometer and plane mirror interferometer to the noise level of 20 pm. Additionally, the optical configuration has the benefit of doubling the measurement resolution when compared to its respective traditional counterparts. Because of non-symmetry in the plane mirror interferometer, a differential plane mirror interferometer to reduce the thermal error is also discussed.

Original language	English (US)
Pages (from-to)	1159-1165
Number of pages	7
Journal	Optics Express
Volume	18
Issue number	2
DOIs	https://doi.org/10.1364/OE.18.001159
State	Published - Jan 18 2010
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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abstract = "A high resolution heterodyne laser interferometer without periodic nonlinearity for linear displacement measurements is described. It uses two spatially separated beams with an offset frequency and an interferometer configuration which has no mixed states to prevent polarization mixing. In this research, a simple interferometer configuration for both retroreflector and plane mirror targets which are both applicable to industrial applications was developed. Experimental results show there is no detectable periodic nonlinearity for both of the retro-reflector interferometer and plane mirror interferometer to the noise level of 20 pm. Additionally, the optical configuration has the benefit of doubling the measurement resolution when compared to its respective traditional counterparts. Because of non-symmetry in the plane mirror interferometer, a differential plane mirror interferometer to reduce the thermal error is also discussed.",

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AU - Buice, Eric S.

AU - Spronck, Jo W.

AU - Schmidt, Robert H.Munnig

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