High resolution mueller matrix imaging polarimetry for understanding high resolution optoelectronic modulators

J. Larry Pezzaniti, Russell A. Chipman

Research output: Contribution to journalConference article

7 Scopus citations

Abstract

A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PL.ZT modulators, quantum well modulators, and surface emmitting lasers. Similarly, the instrument can perform end-to.end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing maps of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.

Original languageEnglish (US)
Pages (from-to)468-480
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2297
DOIs
StatePublished - Sep 29 1994
EventPhotonics for Processors, Neural Networks, and Memories II 1994 - San Diego, United States
Duration: Jul 24 1994Jul 29 1994

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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