High resolution mueller matrix imaging polarimetry for understanding high resolution optoelectronic modulators

J. Larry Pezzaniti, Russell A. Chipman

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PL.ZT modulators, quantum well modulators, and surface emmitting lasers. Similarly, the instrument can perform end-to.end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing maps of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.

Original languageEnglish (US)
Pages (from-to)468-480
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2297
DOIs
StatePublished - Sep 29 1994
EventPhotonics for Processors, Neural Networks, and Memories II 1994 - San Diego, United States
Duration: Jul 24 1994Jul 29 1994

Fingerprint

Mueller Matrix
Polarimetry
Polarimeters
polarimetry
Optoelectronics
Modulator
Optoelectronic devices
Modulators
modulators
Polarization
polarization characteristics
High Resolution
Imaging
Imaging techniques
Optical systems
Optical System
high resolution
matrices
Pixel
Pixels

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

@article{719cd397b71349b89b069db550546613,
title = "High resolution mueller matrix imaging polarimetry for understanding high resolution optoelectronic modulators",
abstract = "A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PL.ZT modulators, quantum well modulators, and surface emmitting lasers. Similarly, the instrument can perform end-to.end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing maps of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.",
author = "Pezzaniti, {J. Larry} and Chipman, {Russell A.}",
year = "1994",
month = "9",
day = "29",
doi = "10.1117/12.187320",
language = "English (US)",
volume = "2297",
pages = "468--480",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - High resolution mueller matrix imaging polarimetry for understanding high resolution optoelectronic modulators

AU - Pezzaniti, J. Larry

AU - Chipman, Russell A.

PY - 1994/9/29

Y1 - 1994/9/29

N2 - A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PL.ZT modulators, quantum well modulators, and surface emmitting lasers. Similarly, the instrument can perform end-to.end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing maps of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.

AB - A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PL.ZT modulators, quantum well modulators, and surface emmitting lasers. Similarly, the instrument can perform end-to.end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing maps of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.

UR - http://www.scopus.com/inward/record.url?scp=85076671095&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076671095&partnerID=8YFLogxK

U2 - 10.1117/12.187320

DO - 10.1117/12.187320

M3 - Conference article

AN - SCOPUS:85076671095

VL - 2297

SP - 468

EP - 480

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -