High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

Elizabeth A. Sornsin, Russell A. Chipman

Research output: Contribution to journalConference article

Abstract

A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10-16 (m/V)2 was determined in the modulator active regions.

Original languageEnglish (US)
Pages (from-to)373-378
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3008
DOIs
StatePublished - Dec 1 1997
Externally publishedYes
EventMiniaturized Systems with Micro-Optics and Micromechanics II - San Jose, CA, United States
Duration: Feb 10 1997Feb 12 1997

Keywords

  • Imaging polarimetry
  • Mueller matrix
  • PLZT
  • Retardance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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