High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

Elizabeth A. Sornsin, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10-16 (m/V)2 was determined in the modulator active regions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsM.E. Motamedi, L.J. Hornbeck, K.S.J. Pister
Pages373-378
Number of pages6
Volume3008
DOIs
StatePublished - 1997
Externally publishedYes
EventMiniaturized Systems with Micro-Optics and Micromechanics II - San Jose, CA, United States
Duration: Feb 10 1997Feb 12 1997

Other

OtherMiniaturized Systems with Micro-Optics and Micromechanics II
CountryUnited States
CitySan Jose, CA
Period2/10/972/12/97

Fingerprint

Polarimeters
polarimetry
polarimeters
Electrooptical effects
Modulators
electro-optics
modulators
Thin films
high resolution
matrices
thin films
Imaging techniques
retarders
electric field strength
Lanthanum
light modulators
lanthanum
Lead
Electric fields
Electric potential

Keywords

  • Imaging polarimetry
  • Mueller matrix
  • PLZT
  • Retardance

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sornsin, E. A., & Chipman, R. A. (1997). High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators. In M. E. Motamedi, L. J. Hornbeck, & K. S. J. Pister (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3008, pp. 373-378) https://doi.org/10.1117/12.271437

High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators. / Sornsin, Elizabeth A.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / M.E. Motamedi; L.J. Hornbeck; K.S.J. Pister. Vol. 3008 1997. p. 373-378.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sornsin, EA & Chipman, RA 1997, High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators. in ME Motamedi, LJ Hornbeck & KSJ Pister (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3008, pp. 373-378, Miniaturized Systems with Micro-Optics and Micromechanics II, San Jose, CA, United States, 2/10/97. https://doi.org/10.1117/12.271437
Sornsin EA, Chipman RA. High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators. In Motamedi ME, Hornbeck LJ, Pister KSJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3008. 1997. p. 373-378 https://doi.org/10.1117/12.271437
Sornsin, Elizabeth A. ; Chipman, Russell A. / High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators. Proceedings of SPIE - The International Society for Optical Engineering. editor / M.E. Motamedi ; L.J. Hornbeck ; K.S.J. Pister. Vol. 3008 1997. pp. 373-378
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