Illumination system tolerancing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Tolerancing of illumination systems is currently a difficult task, especially for components that are injection molded. The ISO standards are not applicable to such systems due to their innate requirements of image formation. Methods to parameterize the shape of injection-molded optical components are presented. First, a method based on experimental measurement of actual components is presented. Next, this method is extended to the Monte Carlo formation of perturbed parts based upon these measurements. Finally, a method based on the application of a bi-directional surface distribution function (BSDF), i.e., scatter profile, is based upon ray-trace results from the application of the experimental measurements. The BSDF method is fit with the ABg scatter function, applied to witness sample surfaces, and compared to the perturbation method. The utility of these two methods is presented, whereby the BSDF method is appropriate for systems with many ray-surface interactions, while the perturbation method is best suited for systems with limited ray-surface interactions.

Original languageEnglish (US)
Title of host publicationOptical System Alignment and Tolerancing
DOIs
StatePublished - Dec 1 2007
EventOptical System Alignment and Tolerancing - San Diego, CA, United States
Duration: Aug 26 2007Aug 27 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6676
ISSN (Print)0277-786X

Other

OtherOptical System Alignment and Tolerancing
CountryUnited States
CitySan Diego, CA
Period8/26/078/27/07

Keywords

  • BSDF
  • Bi-directional surface distribution function
  • Illumination
  • Nonimaging optics
  • Optical engineering and design
  • Scatter model
  • Tolerancing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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