Image of a straight edge in confocal selfinterference microscopy

Dong Kyun Kang, Dae Gab Gweon

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Abstract

An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10–90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10–90% width.

Original languageEnglish (US)
Pages (from-to)1650-1652
Number of pages3
JournalOptics letters
Volume30
Issue number13
DOIs
StatePublished - Jul 1 2005

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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