Image reconstruction for view-limited x-ray CT in baggage scanning

Sagar Mandava, David Coccarelli, Joel A. Greenberg, Michael E. Gehm, Amit Ashok, Ali Bilgin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

X-ray CT based baggage scanners are widely used in security applications. Recently, there has been increased interest in view-limited systems which can improve the scanning throughput while maintaining the threat detection performance. However as very few view angles are acquired in these systems, the image reconstruction problem is challenging. Standard reconstruction algorithms such as the filtered backprojection create strong artifacts when working with view-limited data. In this work, we study the performance of a variety of reconstruction algorithms for both single and multi-energy view-limited systems.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX) II
EditorsEdward D. Franco, Mark A. Neifeld, Amit Ashok, Michael E. Gehm
PublisherSPIE
ISBN (Electronic)9781510608757
DOIs
StatePublished - 2017
EventAnomaly Detection and Imaging with X-Rays (ADIX) II 2017 - Anaheim, United States
Duration: Apr 12 2017Apr 13 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10187
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherAnomaly Detection and Imaging with X-Rays (ADIX) II 2017
CountryUnited States
CityAnaheim
Period4/12/174/13/17

Keywords

  • Image reconstruction
  • security scanning
  • view-limited imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Mandava, S., Coccarelli, D., Greenberg, J. A., Gehm, M. E., Ashok, A., & Bilgin, A. (2017). Image reconstruction for view-limited x-ray CT in baggage scanning. In E. D. Franco, M. A. Neifeld, A. Ashok, & M. E. Gehm (Eds.), Anomaly Detection and Imaging with X-Rays (ADIX) II [101870F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10187). SPIE. https://doi.org/10.1117/12.2265491