Images transfer through thin image guides by pseudo phase conjugation

Yuzuru Takashima; Brandon Hellman; Alex Erstad; Young Sik Kim; Jihun Kim; S. W. Minc

doi:10.1364/AIO.2016.JW4A.32

Images transfer through thin image guides by pseudo phase conjugation

Yuzuru Takashima, Brandon Hellman, Alex Erstad, Young Sik Kim, Jihun Kim, S. W. Minc

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Image transfer through glass substrates by total internal reflections suffer from a Kaleidoscope-like artifacts which severely limits field of view. A retro-reflector array compensates for the artifact along with all the monochromatic and chromatic aberrations.

Original language	English (US)
Title of host publication	Applied Industrial Optics
Subtitle of host publication	Spectroscopy, Imaging and Metrology, AIO 2016
Publisher	OSA - The Optical Society
ISBN (Print)	9781943580156
DOIs	https://doi.org/10.1364/AIO.2016.JW4A.32
State	Published - Jul 18 2016
Event	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016 - Heidelberg, Germany Duration: Jul 25 2016 → Jul 28 2016

Other

Other	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016
Country/Territory	Germany
City	Heidelberg
Period	7/25/16 → 7/28/16

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Mechanics of Materials

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10.1364/AIO.2016.JW4A.32

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Takashima, Y, Hellman, B, Erstad, A, Kim, YS, Kim, J & Minc, SW 2016, Images transfer through thin image guides by pseudo phase conjugation. in Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016. OSA - The Optical Society, Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016, Heidelberg, Germany, 7/25/16. https://doi.org/10.1364/AIO.2016.JW4A.32

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title = "Images transfer through thin image guides by pseudo phase conjugation",

abstract = "Image transfer through glass substrates by total internal reflections suffer from a Kaleidoscope-like artifacts which severely limits field of view. A retro-reflector array compensates for the artifact along with all the monochromatic and chromatic aberrations.",

author = "Yuzuru Takashima and Brandon Hellman and Alex Erstad and Kim, {Young Sik} and Jihun Kim and Minc, {S. W.}",

year = "2016",

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day = "18",

doi = "10.1364/AIO.2016.JW4A.32",

language = "English (US)",

isbn = "9781943580156",

booktitle = "Applied Industrial Optics",

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note = "Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016 ; Conference date: 25-07-2016 Through 28-07-2016",

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T1 - Images transfer through thin image guides by pseudo phase conjugation

AU - Takashima, Yuzuru

AU - Hellman, Brandon

AU - Erstad, Alex

AU - Kim, Young Sik

AU - Kim, Jihun

AU - Minc, S. W.

PY - 2016/7/18

Y1 - 2016/7/18

N2 - Image transfer through glass substrates by total internal reflections suffer from a Kaleidoscope-like artifacts which severely limits field of view. A retro-reflector array compensates for the artifact along with all the monochromatic and chromatic aberrations.

AB - Image transfer through glass substrates by total internal reflections suffer from a Kaleidoscope-like artifacts which severely limits field of view. A retro-reflector array compensates for the artifact along with all the monochromatic and chromatic aberrations.

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U2 - 10.1364/AIO.2016.JW4A.32

DO - 10.1364/AIO.2016.JW4A.32

M3 - Conference contribution

AN - SCOPUS:85019532032

SN - 9781943580156

BT - Applied Industrial Optics

PB - OSA - The Optical Society

T2 - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016

Y2 - 25 July 2016 through 28 July 2016

ER -

Images transfer through thin image guides by pseudo phase conjugation

Abstract

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