Images transfer through thin image guides by pseudo phase conjugation

Yuzuru Takashima, Brandon Hellman, Alex Erstad, Young Sik Kim, Jihun Kim, S. W. Minc

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Image transfer through glass substrates by total internal reflections suffer from a Kaleidoscope-like artifacts which severely limits field of view. A retro-reflector array compensates for the artifact along with all the monochromatic and chromatic aberrations.

Original languageEnglish (US)
Title of host publicationApplied Industrial Optics
Subtitle of host publicationSpectroscopy, Imaging and Metrology, AIO 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580156
DOIs
StatePublished - Jul 18 2016
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016 - Heidelberg, Germany
Duration: Jul 25 2016Jul 28 2016

Other

OtherApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016
CountryGermany
CityHeidelberg
Period7/25/167/28/16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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  • Cite this

    Takashima, Y., Hellman, B., Erstad, A., Kim, Y. S., Kim, J., & Minc, S. W. (2016). Images transfer through thin image guides by pseudo phase conjugation. In Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2016 OSA - The Optical Society. https://doi.org/10.1364/AIO.2016.JW4A.32