Imaging aberrations from null correctors

Chunyu Zhao, James H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

To test an aspheric surface, usually a null lens is designed to create an aspheric wavefront that matches the surface. The null lens also relays the image of the surface under test to the interferometer. The effect of image distortion from the null lens is well known, and is accommodated by remapping the data. Imaging aberrations created by the null lens also affect the measurement by smoothing out wavefront errors which correspond to ripples in the surface. This leads to data that does not faithfully represent the surface. We characterize this smoothing using a measurement transfer function, which is analogous to the modulation transfer function used to quantify the performance of imaging systems. In this paper we present a technique and tools for predicting the transfer function for a null test.

Original languageEnglish (US)
Title of host publication3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptical Test and Measurement Technology and Equipment
DOIs
StatePublished - Dec 1 2007
Event3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China
Duration: Jul 8 2007Jul 12 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6723
ISSN (Print)0277-786X

Other

Other3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
CountryChina
CityChengdu
Period7/8/077/12/07

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Zhao, C., & Burge, J. H. (2007). Imaging aberrations from null correctors. In 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment [67230L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6723). https://doi.org/10.1117/12.782920