Imaging electron interferometer

A. C. Bleszynski, K. E. Aidala, Brian J Leroy, R. M. Westervelt, E. J. Heller, K. D. Maranowski, A. C. Gossard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An imaging electron interferometer was created in a two-dimensional electron gas (2DEG) using a liquid-He cooled scanning probe microscope (SPM). Electron waves emitted from a quantum point contact (QPC) return to the QPC along two paths: reflection from a concave mirror formed by a gate, and backscattering from the depleted disc underneath the charged SPM tip. Interference of these waves when they return to the QPC produces strong interference fringes in images of electron flow. A quantum phase shifter is formed by moving the mirror via its gate voltage - the fringes move a corresponding amount. The coherent fringes are robust to thermal averaging when the lengths of the two paths are within lT = vF/πk BT of each other.

Original languageEnglish (US)
Title of host publicationAIP Conference Proceedings
Pages1461-1462
Number of pages2
Volume772
DOIs
StatePublished - Jun 30 2005
Externally publishedYes
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: Jul 26 2004Jul 30 2004

Other

OtherPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
CountryUnited States
CityFlagstaff, AZ
Period7/26/047/30/04

Fingerprint

interferometers
microscopes
mirrors
interference
electrons
scanning
probes
electron gas
backscattering
electric potential
liquids

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Bleszynski, A. C., Aidala, K. E., Leroy, B. J., Westervelt, R. M., Heller, E. J., Maranowski, K. D., & Gossard, A. C. (2005). Imaging electron interferometer. In AIP Conference Proceedings (Vol. 772, pp. 1461-1462) https://doi.org/10.1063/1.1994666

Imaging electron interferometer. / Bleszynski, A. C.; Aidala, K. E.; Leroy, Brian J; Westervelt, R. M.; Heller, E. J.; Maranowski, K. D.; Gossard, A. C.

AIP Conference Proceedings. Vol. 772 2005. p. 1461-1462.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bleszynski, AC, Aidala, KE, Leroy, BJ, Westervelt, RM, Heller, EJ, Maranowski, KD & Gossard, AC 2005, Imaging electron interferometer. in AIP Conference Proceedings. vol. 772, pp. 1461-1462, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27, Flagstaff, AZ, United States, 7/26/04. https://doi.org/10.1063/1.1994666
Bleszynski AC, Aidala KE, Leroy BJ, Westervelt RM, Heller EJ, Maranowski KD et al. Imaging electron interferometer. In AIP Conference Proceedings. Vol. 772. 2005. p. 1461-1462 https://doi.org/10.1063/1.1994666
Bleszynski, A. C. ; Aidala, K. E. ; Leroy, Brian J ; Westervelt, R. M. ; Heller, E. J. ; Maranowski, K. D. ; Gossard, A. C. / Imaging electron interferometer. AIP Conference Proceedings. Vol. 772 2005. pp. 1461-1462
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