Imaging ellipsometry of optical coatings in situ

Russell A. Chipman, Joseph L. Pezzaniti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A Mueller matrix imaging polarimeter has been developed and demonstrated for characterizing the polarization properties of optical coatings in place in optical systems. This Mueller matrix imaging polarimeter is a form of ellipsometer which measures the polarization characteristics of ray paths through systems in image form. It is a highly versatile instrument capable of making a variety of polarimetric measurements on optical samples or entire optical systems. Two data sets will be presented. The first shows the polarization behavior for example lenses which display the typical Maltese cross variation. The second shows images of polarizing beam splitter behavior as a function of angle of incidence, clearly showing how the plane of polarization as determined by the s- and p-planes rotates for light incident out of the normal plane.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages124-134
Number of pages11
ISBN (Print)0819415863
StatePublished - Dec 1 1994
Externally publishedYes
EventOptical Thin Films IV: New Developments - San Diego, CA, USA
Duration: Jul 25 1994Jul 27 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2262
ISSN (Print)0277-786X

Other

OtherOptical Thin Films IV: New Developments
CitySan Diego, CA, USA
Period7/25/947/27/94

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Chipman, R. A., & Pezzaniti, J. L. (1994). Imaging ellipsometry of optical coatings in situ. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 124-134). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2262). Society of Photo-Optical Instrumentation Engineers.