Imaging Fullerene C60 With Atomic Resolution Using A Scanning Tunnelling Microscope

Djuro Koruga, Jovana Simic-Krstic, Mirko Trifunovic, Svetlana Jankovic, Stuart R Hameroff, James C. Withers, Raoulf O. Loutfy

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

C60 was purified and imaged utilizing scanning tunnelling microscopy (STM) in a constant current mode. By fixing the Fullerenes on the substrate (“frozen state” - no movement or rotation), direct imaging of C60 with atomic resolution was possible, showing one pentagon and one hexagon carbon ring of C60.

Original languageEnglish (US)
Pages (from-to)93-100
Number of pages8
JournalFullerene Science and Technology
Volume1
Issue number1
DOIs
StatePublished - Feb 1 1993

Fingerprint

Fullerenes
hexagons
Scanning tunneling microscopy
fixing
fullerenes
scanning tunneling microscopy
Microscopes
Carbon
microscopes
Scanning
Imaging techniques
scanning
carbon
rings
Substrates
fullerene C60

ASJC Scopus subject areas

  • Chemical Engineering(all)

Cite this

Koruga, D., Simic-Krstic, J., Trifunovic, M., Jankovic, S., Hameroff, S. R., Withers, J. C., & Loutfy, R. O. (1993). Imaging Fullerene C60 With Atomic Resolution Using A Scanning Tunnelling Microscope. Fullerene Science and Technology, 1(1), 93-100. https://doi.org/10.1080/15363839308015518

Imaging Fullerene C60 With Atomic Resolution Using A Scanning Tunnelling Microscope. / Koruga, Djuro; Simic-Krstic, Jovana; Trifunovic, Mirko; Jankovic, Svetlana; Hameroff, Stuart R; Withers, James C.; Loutfy, Raoulf O.

In: Fullerene Science and Technology, Vol. 1, No. 1, 01.02.1993, p. 93-100.

Research output: Contribution to journalArticle

Koruga, D, Simic-Krstic, J, Trifunovic, M, Jankovic, S, Hameroff, SR, Withers, JC & Loutfy, RO 1993, 'Imaging Fullerene C60 With Atomic Resolution Using A Scanning Tunnelling Microscope', Fullerene Science and Technology, vol. 1, no. 1, pp. 93-100. https://doi.org/10.1080/15363839308015518
Koruga, Djuro ; Simic-Krstic, Jovana ; Trifunovic, Mirko ; Jankovic, Svetlana ; Hameroff, Stuart R ; Withers, James C. ; Loutfy, Raoulf O. / Imaging Fullerene C60 With Atomic Resolution Using A Scanning Tunnelling Microscope. In: Fullerene Science and Technology. 1993 ; Vol. 1, No. 1. pp. 93-100.
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