Imaging nanostructures with scanning photoionization microscopy

Oliver L A Monti Masel, Thomas A. Baker, David J. Nesbitt

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

We report detailed studies of local electronic properties in nanostructured thin metallic films using scanning photoionization microscopy. This novel form of microscopy combines the advantages of diffraction-limited optical excitation with the ability to detect both photons and low kinetic energy photoelectrons, permitting sensitive characterization of heterogeneous surfaces under vacuum conditions. Using this technique, correlated measurements of multiphoton photoemission cross section and optical penetration depth are reported for Au films supported on Pt. These results present a first step toward combining confocal fluorescence or Raman microscopy with time-resolved photoelectron imaging spectroscopy in complex metal film environments, which should be ideally suited to investigating local plasmonic effects in nanostructures.

Original languageEnglish (US)
Article number154709
JournalThe Journal of Chemical Physics
Volume125
Issue number15
DOIs
StatePublished - 2006

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Photoionization
photoionization
Nanostructures
Microscopic examination
Photoelectrons
microscopy
Scanning
Imaging techniques
scanning
photoelectrons
Metallic films
Photoexcitation
Coordination Complexes
Photoemission
metal films
Kinetic energy
Electronic properties
photoelectric emission
penetration
Photons

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Imaging nanostructures with scanning photoionization microscopy. / Monti Masel, Oliver L A; Baker, Thomas A.; Nesbitt, David J.

In: The Journal of Chemical Physics, Vol. 125, No. 15, 154709, 2006.

Research output: Contribution to journalArticle

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