Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of alignment. In this paper we show how the Abbe sine condition can be used to relate the mapping between the entrance and exit pupils to image aberrations that have linear field dependence. This mapping error then can be used to measure the linear astigmatism caused by the misalignment. Additionally, we present experimental results from the sine condition test on a simple system.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering