Implementation of sine condition test to measure optical system misalignments

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of alignment. In this paper we show how the Abbe sine condition can be used to relate the mapping between the entrance and exit pupils to image aberrations that have linear field dependence. This mapping error then can be used to measure the linear astigmatism caused by the misalignment. Additionally, we present experimental results from the sine condition test on a simple system.

Original languageEnglish (US)
Pages (from-to)6391-6398
Number of pages8
JournalApplied Optics
Volume50
Issue number34
StatePublished - Dec 1 2011

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Optical systems
misalignment
pupils
Aberrations
aberration
alignment
astigmatism
entrances

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Implementation of sine condition test to measure optical system misalignments. / Lampen, Sara; Dubin, Matthew B; Burge, James H.

In: Applied Optics, Vol. 50, No. 34, 01.12.2011, p. 6391-6398.

Research output: Contribution to journalArticle

@article{00ebe9c10a1f4fd790d9c52c2f978d50,
title = "Implementation of sine condition test to measure optical system misalignments",
abstract = "Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of alignment. In this paper we show how the Abbe sine condition can be used to relate the mapping between the entrance and exit pupils to image aberrations that have linear field dependence. This mapping error then can be used to measure the linear astigmatism caused by the misalignment. Additionally, we present experimental results from the sine condition test on a simple system.",
author = "Sara Lampen and Dubin, {Matthew B} and Burge, {James H}",
year = "2011",
month = "12",
day = "1",
language = "English (US)",
volume = "50",
pages = "6391--6398",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "34",

}

TY - JOUR

T1 - Implementation of sine condition test to measure optical system misalignments

AU - Lampen, Sara

AU - Dubin, Matthew B

AU - Burge, James H

PY - 2011/12/1

Y1 - 2011/12/1

N2 - Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of alignment. In this paper we show how the Abbe sine condition can be used to relate the mapping between the entrance and exit pupils to image aberrations that have linear field dependence. This mapping error then can be used to measure the linear astigmatism caused by the misalignment. Additionally, we present experimental results from the sine condition test on a simple system.

AB - Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of alignment. In this paper we show how the Abbe sine condition can be used to relate the mapping between the entrance and exit pupils to image aberrations that have linear field dependence. This mapping error then can be used to measure the linear astigmatism caused by the misalignment. Additionally, we present experimental results from the sine condition test on a simple system.

UR - http://www.scopus.com/inward/record.url?scp=83155193125&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=83155193125&partnerID=8YFLogxK

M3 - Article

C2 - 22192991

AN - SCOPUS:83155193125

VL - 50

SP - 6391

EP - 6398

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 34

ER -