Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes

Tribikram Kundu, Claus S. Jørgensen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Acoustic microscopes can be used to measure Rayleigh and longitudinal or P-wave speeds in a specimen at microscopic resolution. The wave speeds are obtained from the interference pattern as a function of the defocus distance or V(z) curve. The received signal voltage amplitude Vis generated by two beams - the normally reflected central beam and a non-specularly reflected beam that strikes the fluid-solid interface at critical angle. It is shown in this paper that instead of analyzing the interference pattern between these two beams if we consider two other beams that follow the same path but travel through the coupling fluid multiple times before interfering then the V(z) curve generated by this higher order interference gives more accurate values for the material properties. The spacing distance between two successive dips of the V(z) curve is smaller for the higher order interference. The higher order interference, although weaker, gives more accurate results. Justification for the greater accuracy of the higher order interference is given in the paper. Material properties of silicon and bone are obtained by the new technique.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers (Publication) NDE
EditorsC. Darvennes, T. Kundu
Pages99-105
Number of pages7
Volume20
StatePublished - 2001
EventProceedings of the 7th ASME NDE Tropical Conference - 2001 - San Antonio, TX, United States
Duration: Apr 23 2001Apr 25 2001

Other

OtherProceedings of the 7th ASME NDE Tropical Conference - 2001
CountryUnited States
CitySan Antonio, TX
Period4/23/014/25/01

Fingerprint

Acoustic microscopes
Materials properties
Fluids
Bone
Silicon
Electric potential

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Kundu, T., & Jørgensen, C. S. (2001). Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes. In C. Darvennes, & T. Kundu (Eds.), American Society of Mechanical Engineers (Publication) NDE (Vol. 20, pp. 99-105)

Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes. / Kundu, Tribikram; Jørgensen, Claus S.

American Society of Mechanical Engineers (Publication) NDE. ed. / C. Darvennes; T. Kundu. Vol. 20 2001. p. 99-105.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kundu, T & Jørgensen, CS 2001, Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes. in C Darvennes & T Kundu (eds), American Society of Mechanical Engineers (Publication) NDE. vol. 20, pp. 99-105, Proceedings of the 7th ASME NDE Tropical Conference - 2001, San Antonio, TX, United States, 4/23/01.
Kundu T, Jørgensen CS. Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes. In Darvennes C, Kundu T, editors, American Society of Mechanical Engineers (Publication) NDE. Vol. 20. 2001. p. 99-105
Kundu, Tribikram ; Jørgensen, Claus S. / Importance of multiply reflected signals in V(z) curve analysis for material characterization by acoustic microscopes. American Society of Mechanical Engineers (Publication) NDE. editor / C. Darvennes ; T. Kundu. Vol. 20 2001. pp. 99-105
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