Improvements in the scanning long-wave optical test system

Hyemin Yoo, Gregory A Smith, Chang Jin Oh, Andrew E. Lowman, Matthew B Dubin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The Scanning Long-wave Optical Test System (SLOTS) is a slope measuring deflectometry system that provides accurate measurements on ground surfaces. As it uses a thermal source, we can measure an optic during the grinding phase which allows us to correct figure errors when material removal is much faster. We have made improvements in SLOTS, such as the step-And-stare method, the ceramic rod, and the Gaussian fitting processing software, so that this system supports higher accuracy and resolution. As a result, SLOTS is an optical testing system that covers a huge portion of the fabrication process from the grinding to the figuring. It is a complementary solution for other metrology systems such as the laser tracker, SCOTS, and null interferometry. SLOTS can reduce the manufacturing time by producing ground aspheres that have low errors of the surface figure when polishing begins.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing XII
EditorsRay Williamson, Dae Wook Kim, Rolf Rascher
PublisherSPIE
Volume10742
ISBN (Electronic)9781510620551
DOIs
StatePublished - Jan 1 2018
EventOptical Manufacturing and Testing XII 2018 - San Diego, United States
Duration: Aug 20 2018Aug 22 2018

Other

OtherOptical Manufacturing and Testing XII 2018
CountryUnited States
CitySan Diego
Period8/20/188/22/18

Fingerprint

Test System
planetary waves
Optical System
Scanning
scanning
Grinding
grinding
Figure
Optical testing
Asphere
Optical Testing
Polishing
aspheric optics
Interferometry
Metrology
support systems
Null
Optics
Fabrication
Slope

Keywords

  • Aspheric mirror
  • Deflectometry
  • Ground surface
  • optical testing
  • slope measurement
  • SLOTS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Yoo, H., Smith, G. A., Oh, C. J., Lowman, A. E., & Dubin, M. B. (2018). Improvements in the scanning long-wave optical test system. In R. Williamson, D. W. Kim, & R. Rascher (Eds.), Optical Manufacturing and Testing XII (Vol. 10742). [1074216] SPIE. https://doi.org/10.1117/12.2321265

Improvements in the scanning long-wave optical test system. / Yoo, Hyemin; Smith, Gregory A; Oh, Chang Jin; Lowman, Andrew E.; Dubin, Matthew B.

Optical Manufacturing and Testing XII. ed. / Ray Williamson; Dae Wook Kim; Rolf Rascher. Vol. 10742 SPIE, 2018. 1074216.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoo, H, Smith, GA, Oh, CJ, Lowman, AE & Dubin, MB 2018, Improvements in the scanning long-wave optical test system. in R Williamson, DW Kim & R Rascher (eds), Optical Manufacturing and Testing XII. vol. 10742, 1074216, SPIE, Optical Manufacturing and Testing XII 2018, San Diego, United States, 8/20/18. https://doi.org/10.1117/12.2321265
Yoo H, Smith GA, Oh CJ, Lowman AE, Dubin MB. Improvements in the scanning long-wave optical test system. In Williamson R, Kim DW, Rascher R, editors, Optical Manufacturing and Testing XII. Vol. 10742. SPIE. 2018. 1074216 https://doi.org/10.1117/12.2321265
Yoo, Hyemin ; Smith, Gregory A ; Oh, Chang Jin ; Lowman, Andrew E. ; Dubin, Matthew B. / Improvements in the scanning long-wave optical test system. Optical Manufacturing and Testing XII. editor / Ray Williamson ; Dae Wook Kim ; Rolf Rascher. Vol. 10742 SPIE, 2018.
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