Improving spatial resolution in semiconductor gamma-ray detectors using a list-mode EM algorithm for fluence estimation

D. G. Marks, H. B. Barber, H. H. Barrett, J. M. Woolfenden

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We present a method for applying the expectation-maximization (EM) algorithm to semiconductor gamma-ray imaging detectors to reconstruct images from sets of electrode data. The EM algorithm iteratively seeks an image described by a distribution of fluence, or gamma rays per unit area, that has the greatest probability of producing the observed set of data. The algorithm acts without estimating interaction positions for individual gamma rays. When applying the algorithm to data from a Cd0.8Zn0.2Te detector with square pixel electrodes spaced 125 μm we get a spatial resolution of 40 μm for 60 keV gamma rays, compared with 104 μm resolution when individual interaction positions are estimated.

Original languageEnglish (US)
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
PublisherIEEE
Pages657-661
Number of pages5
ISBN (Print)0780350227
StatePublished - Jan 1 1999
EventProceedings of the 1998 IEEE Nuclear Science Symposium Conference Record - Toronto, Que, Can
Duration: Nov 8 1998Nov 14 1998

Publication series

NameIEEE Nuclear Science Symposium and Medical Imaging Conference
Volume1

Other

OtherProceedings of the 1998 IEEE Nuclear Science Symposium Conference Record
CityToronto, Que, Can
Period11/8/9811/14/98

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

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  • Cite this

    Marks, D. G., Barber, H. B., Barrett, H. H., & Woolfenden, J. M. (1999). Improving spatial resolution in semiconductor gamma-ray detectors using a list-mode EM algorithm for fluence estimation. In IEEE Nuclear Science Symposium and Medical Imaging Conference (pp. 657-661). (IEEE Nuclear Science Symposium and Medical Imaging Conference; Vol. 1). IEEE.