In-process metrology for segmented optics UV curing control

Heejoo Choi, Marcos A. Esparza, Ariel Lamdan, Yi Ting Feng, Tom Milster, Daniel Apai, Dae Wook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Powerful and novel telescope design is key to pushing the available limits of astronomical sciences and a segmented primary is an attractive approach. For the Nautilus Space mission, a segmented lens has been proposed to replace large monolithic primary optics for the purpose of survey faint objects like exo-planets as well as time-domain astrophysics observations. Enabling technology for Nautilus is an ultra-lightweight multi-order diffractive engineered (MODE) lens that replaces bulky primary mirrors. The MODE lens consists of multiple, identical, molded segments. This is because the complicated optical design of both the diffractive surfaces is not easily manufacturable by traditional fabrication methods. Besides, the molding approach for identical segmented optics allows for a cost-efficient process. Conversely, the fusion of segmented optics demands high precision metrology and a delicate assembly strategy. We propose an in-process metrology technique that mitigates post-assembly process complications. This system monitors the co-phase character of the segmented optics during UV cured assembly, guiding the overall process.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing XIII
EditorsDae Wook Kim, Rolf Rascher
PublisherSPIE
ISBN (Electronic)9781510637801
DOIs
StatePublished - 2020
EventOptical Manufacturing and Testing XIII 2020 - Virtual, Online, United States
Duration: Aug 24 2020Sep 4 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11487
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Manufacturing and Testing XIII 2020
CountryUnited States
CityVirtual, Online
Period8/24/209/4/20

Keywords

  • In-process metrology
  • Metrology
  • Multi-segmented optics
  • Wide dynamic range and high precision test

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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