In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing

Weigang Wang, J. Jordan-Sweet, G. X. Miao, C. Ni, A. K. Rumaiz, L. R. Shah, X. Fan, P. Parsons, R. Stearrett, E. R. Nowak, J. S. Moodera, J. Q. Xiao

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

We report the crystallization study of CoFeB/MgO/CoFeB magnetic tunnel junctions using in-situ, time-resolved synchrotron-based x-ray diffraction and transmission electron microscopy. It was found that the crystallization of amorphous CoFeB electrodes occurs on a time scale of seconds during the postgrowth high temperature annealing. The crystallization can be well fit by the Johnson-Mehl-Avrami model and the effective activation energy of the process was determined to be 150 kJ/mol. The solid-state epitaxy mode of CoFeB was found to involve separate crystallization at different locations followed by subsequent merging of small grains, instead of layer-by-layer growth of CoFeB film along the MgO template.

Original languageEnglish (US)
Article number242501
JournalApplied Physics Letters
Volume95
Issue number24
DOIs
StatePublished - Dec 14 2009
Externally publishedYes

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crystallization
annealing
electrodes
tunnel junctions
epitaxy
synchrotrons
x ray diffraction
templates
activation energy
solid state
transmission electron microscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing. / Wang, Weigang; Jordan-Sweet, J.; Miao, G. X.; Ni, C.; Rumaiz, A. K.; Shah, L. R.; Fan, X.; Parsons, P.; Stearrett, R.; Nowak, E. R.; Moodera, J. S.; Xiao, J. Q.

In: Applied Physics Letters, Vol. 95, No. 24, 242501, 14.12.2009.

Research output: Contribution to journalArticle

Wang, W, Jordan-Sweet, J, Miao, GX, Ni, C, Rumaiz, AK, Shah, LR, Fan, X, Parsons, P, Stearrett, R, Nowak, ER, Moodera, JS & Xiao, JQ 2009, 'In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing', Applied Physics Letters, vol. 95, no. 24, 242501. https://doi.org/10.1063/1.3273397
Wang, Weigang ; Jordan-Sweet, J. ; Miao, G. X. ; Ni, C. ; Rumaiz, A. K. ; Shah, L. R. ; Fan, X. ; Parsons, P. ; Stearrett, R. ; Nowak, E. R. ; Moodera, J. S. ; Xiao, J. Q. / In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing. In: Applied Physics Letters. 2009 ; Vol. 95, No. 24.
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AU - Miao, G. X.

AU - Ni, C.

AU - Rumaiz, A. K.

AU - Shah, L. R.

AU - Fan, X.

AU - Parsons, P.

AU - Stearrett, R.

AU - Nowak, E. R.

AU - Moodera, J. S.

AU - Xiao, J. Q.

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