Incidence-angle dependent external quantum efficiency: Laboratory characterization and use in irradiance-to-power modeling

Barrett G Potter, C. W. Hansen, J. H. Simmons, B. H. King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

We propose and analyze the use of an angle-of-incidence (AOI)-dependent external quantum efficiency (EQE) as the basis for a more accurate representation of specular reflection and diffuse light utilization in PV system modeling. We derive a response function defined by the ratio of the EQE spectrum at a given incidence angle to that at normal incidence as a replacement for the f2 and fd parameters in the Sandia Array Performance Model (SAPM). The response function can be obtained from measurements readily made in the laboratory, providing a rapid, versatile method for more accurately calibrating module performance models.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

Keywords

  • external quantum efficiency
  • irradiance-to-power model
  • photovoltaic cells

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Potter, B. G., Hansen, C. W., Simmons, J. H., & King, B. H. (2015). Incidence-angle dependent external quantum efficiency: Laboratory characterization and use in irradiance-to-power modeling. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7355998] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7355998