Influence of the dielectric environment on the radiative lifetime of quantum-well excitons

D. Ammerlahn, B. Grote, Stephan W Koch

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Due to the large mismatch in the refractive index of semiconductor material and air, time-integrated and spectrally resolved four-wave mixing experiments reveal strong influence of the cladding layer thickness, its refractive index, and the reflectivity of the sample-air interface on the radiative dephasing time of excitons in single quantum wells and multiple quantum well structures. A cladding layer thickness of λ/2 and λ/4 enhances and decreases, respectively, the radiative contribution to the exciton linewidth and causes radiative shifts to higher and lower energies, respectively. All our experiments are well described by solutions of the semiconductor Maxwell-Bloch equations.

Original languageEnglish (US)
Pages (from-to)4801-4805
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume61
Issue number7
DOIs
StatePublished - Jan 1 2000
Externally publishedYes

Fingerprint

radiative lifetime
Excitons
Semiconductor quantum wells
Refractive index
excitons
quantum wells
refractivity
Semiconductor materials
Four wave mixing
air
Maxwell equations
Air
four-wave mixing
Linewidth
Experiments
reflectance
causes
shift
LDS 751
energy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Influence of the dielectric environment on the radiative lifetime of quantum-well excitons. / Ammerlahn, D.; Grote, B.; Koch, Stephan W.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 61, No. 7, 01.01.2000, p. 4801-4805.

Research output: Contribution to journalArticle

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