Information-based expert systems for atomic emission spectroscopy

Robert S. Pomeroy, J. D. Kolczynski, M Bonner Denton

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

The development of the direct-current plasma echelle/CID spectroscopic system for atomic emission spectroscopy (AES) provides new alternatives for automated system control and data analysis. With this system, the concept of the 'intelligent' spectrometer becomes tangible. The echelle/CID system simultaneously gathers a wealth of spectral information over a wide spectral region. The mechanical stability of the system and the absence of moving parts give rise to reproducible wavelength assignment. The large amount of spectral information acquired has led to the development of information-based expert systems for AES: automated qualitative analysis, semi-quantitative analysis, and an 'on the fly' matrix-dependent line selection. These algorithms are effective in situations where there is a large variability among samples. The analytical power of these routines is heavily dependent on their utilization of the large database and the use of fundamental spectroscopic principles. Examples of the use of these algorithms in environmental monitoring, in the identification of chemical waste, in the analysis of geologic materials and steels, and in HPLC-AES are presented.

Original languageEnglish (US)
Pages (from-to)1111-1119
Number of pages9
JournalApplied Spectroscopy
Volume45
Issue number7
StatePublished - Aug 1991
Externally publishedYes

Fingerprint

Atomic emission spectroscopy
expert systems
charge injection devices
Expert systems
Chemical wastes
spectroscopy
environmental monitoring
data systems
Mechanical stability
qualitative analysis
Steel
quantitative analysis
Spectrometers
direct current
steels
spectrometers
Plasmas
Control systems
Wavelength
Monitoring

ASJC Scopus subject areas

  • Spectroscopy
  • Instrumentation

Cite this

Information-based expert systems for atomic emission spectroscopy. / Pomeroy, Robert S.; Kolczynski, J. D.; Denton, M Bonner.

In: Applied Spectroscopy, Vol. 45, No. 7, 08.1991, p. 1111-1119.

Research output: Contribution to journalArticle

Pomeroy, RS, Kolczynski, JD & Denton, MB 1991, 'Information-based expert systems for atomic emission spectroscopy', Applied Spectroscopy, vol. 45, no. 7, pp. 1111-1119.
Pomeroy, Robert S. ; Kolczynski, J. D. ; Denton, M Bonner. / Information-based expert systems for atomic emission spectroscopy. In: Applied Spectroscopy. 1991 ; Vol. 45, No. 7. pp. 1111-1119.
@article{23d3110be9d04a6a901918827a1be48c,
title = "Information-based expert systems for atomic emission spectroscopy",
abstract = "The development of the direct-current plasma echelle/CID spectroscopic system for atomic emission spectroscopy (AES) provides new alternatives for automated system control and data analysis. With this system, the concept of the 'intelligent' spectrometer becomes tangible. The echelle/CID system simultaneously gathers a wealth of spectral information over a wide spectral region. The mechanical stability of the system and the absence of moving parts give rise to reproducible wavelength assignment. The large amount of spectral information acquired has led to the development of information-based expert systems for AES: automated qualitative analysis, semi-quantitative analysis, and an 'on the fly' matrix-dependent line selection. These algorithms are effective in situations where there is a large variability among samples. The analytical power of these routines is heavily dependent on their utilization of the large database and the use of fundamental spectroscopic principles. Examples of the use of these algorithms in environmental monitoring, in the identification of chemical waste, in the analysis of geologic materials and steels, and in HPLC-AES are presented.",
author = "Pomeroy, {Robert S.} and Kolczynski, {J. D.} and Denton, {M Bonner}",
year = "1991",
month = "8",
language = "English (US)",
volume = "45",
pages = "1111--1119",
journal = "Applied Spectroscopy",
issn = "0003-7028",
publisher = "Society for Applied Spectroscopy",
number = "7",

}

TY - JOUR

T1 - Information-based expert systems for atomic emission spectroscopy

AU - Pomeroy, Robert S.

AU - Kolczynski, J. D.

AU - Denton, M Bonner

PY - 1991/8

Y1 - 1991/8

N2 - The development of the direct-current plasma echelle/CID spectroscopic system for atomic emission spectroscopy (AES) provides new alternatives for automated system control and data analysis. With this system, the concept of the 'intelligent' spectrometer becomes tangible. The echelle/CID system simultaneously gathers a wealth of spectral information over a wide spectral region. The mechanical stability of the system and the absence of moving parts give rise to reproducible wavelength assignment. The large amount of spectral information acquired has led to the development of information-based expert systems for AES: automated qualitative analysis, semi-quantitative analysis, and an 'on the fly' matrix-dependent line selection. These algorithms are effective in situations where there is a large variability among samples. The analytical power of these routines is heavily dependent on their utilization of the large database and the use of fundamental spectroscopic principles. Examples of the use of these algorithms in environmental monitoring, in the identification of chemical waste, in the analysis of geologic materials and steels, and in HPLC-AES are presented.

AB - The development of the direct-current plasma echelle/CID spectroscopic system for atomic emission spectroscopy (AES) provides new alternatives for automated system control and data analysis. With this system, the concept of the 'intelligent' spectrometer becomes tangible. The echelle/CID system simultaneously gathers a wealth of spectral information over a wide spectral region. The mechanical stability of the system and the absence of moving parts give rise to reproducible wavelength assignment. The large amount of spectral information acquired has led to the development of information-based expert systems for AES: automated qualitative analysis, semi-quantitative analysis, and an 'on the fly' matrix-dependent line selection. These algorithms are effective in situations where there is a large variability among samples. The analytical power of these routines is heavily dependent on their utilization of the large database and the use of fundamental spectroscopic principles. Examples of the use of these algorithms in environmental monitoring, in the identification of chemical waste, in the analysis of geologic materials and steels, and in HPLC-AES are presented.

UR - http://www.scopus.com/inward/record.url?scp=0026201278&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026201278&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0026201278

VL - 45

SP - 1111

EP - 1119

JO - Applied Spectroscopy

JF - Applied Spectroscopy

SN - 0003-7028

IS - 7

ER -