Infrared reflection-absorption spectroscope using thin film structures

S. J. Finke, G. L. Schrader

Research output: Contribution to journalArticle

19 Scopus citations

Abstract

Infrared reflection-absorption spectroscopy (IRRAS) has been used extensively in the study of adsorbates and thin layers on metal surfaces, but little work has been performed on non-metals due to the low sensitivity which results when these materials are used. In this work, thin film structures consisting of a thin layer of a semiconductor (silicon) on a metal (copper) surface are used to increase the sensitivity of the technique for examining layers of poly(methylmethacrylate).

Original languageEnglish (US)
Pages (from-to)91-96
Number of pages6
JournalSpectrochimica Acta Part A: Molecular Spectroscopy
Volume46
Issue number1
DOIs
StatePublished - 1990

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Infrared reflection-absorption spectroscope using thin film structures'. Together they form a unique fingerprint.

  • Cite this