Infrared reflection-absorption spectroscopy (IRRAS) has been used extensively in the study of adsorbates and thin layers on metal surfaces, but little work has been performed on non-metals due to the low sensitivity which results when these materials are used. In this work, thin film structures consisting of a thin layer of a semiconductor (silicon) on a metal (copper) surface are used to increase the sensitivity of the technique for examining layers of poly(methylmethacrylate).
|Original language||English (US)|
|Number of pages||6|
|Journal||Spectrochimica Acta Part A: Molecular Spectroscopy|
|Publication status||Published - 1990|
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