Instantaneous wavefront measurement based on deflectometry

Zhongming Xie, Daodang Wang, Hanting Gu, Ming Kong, Rongguang Liang, Wentao Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The deflectometry enables high-precision wavefront measurement with large dynamic range. Traditional multi-step phase-shifting fringe-illumination deflectometric methods involve at least three sinusoidal phase-shifting fringe patterns and require a sequential projection, making it not feasible for the instantaneous measurement. In this paper, a colorcoded method with frequency-carrier patterns is proposed to achieve the instantaneous wavefront measurement based on deflectometry. With the color extraction from different channels, composite patterns in x and y directions can be well separated with a single shot. Then, the phase-shifting patterns encoded in different frequencies can be demodulated with the designed filters, by which the local wavefront slopes can be obtained simultaneously to reconstruct the wavefront under test. Both the numerical simulation and experiments are performed to validate the feasibility of proposed method. The proposed method provides a feasible way for the real-time and instantaneous measurement with large dynamic range based on deflectometry.

Original languageEnglish (US)
Title of host publicationOptical Design and Testing IX
EditorsYongtian Wang, Pablo Benitez, Osamu Matoba
PublisherSPIE
ISBN (Electronic)9781510630871
DOIs
StatePublished - Jan 1 2019
EventOptical Design and Testing IX 2019 - Hangzhou, China
Duration: Oct 21 2019Oct 22 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11185
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Design and Testing IX 2019
CountryChina
CityHangzhou
Period10/21/1910/22/19

Keywords

  • Color-coded method
  • Frequency carrier
  • Fringe illumination
  • Instantaneous deflectometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Xie, Z., Wang, D., Gu, H., Kong, M., Liang, R., & Zhang, W. (2019). Instantaneous wavefront measurement based on deflectometry. In Y. Wang, P. Benitez, & O. Matoba (Eds.), Optical Design and Testing IX [111850Q] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11185). SPIE. https://doi.org/10.1117/12.2537148