Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer

R. Starr, P. E. Clark, M. E. Murphy, S. R. Floyd, T. P. McClanahan, L. R. Nittler, J. I. Trombka, L. G. Evans, William V. Boynton, S. H. Bailey, J. Bhangoo, I. Mikheeva, J. Brückner, S. W. Squyres, E. M. McCartney, J. O. Goldsten, R. L. McNutt

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

The X-Ray spectrometer onboard the Near Earth Asteroid Rendezvous spacecraft will measure X-rays from the surface of 433 Eros in the energy region 0.7-10 keV. Detection of characteristic Kα line emissions from Mg, Al, Si, Ca, Ti, and Fe will allow the determination of surface abundances of these geologically important elements. Spatial resolution as fine as 3 km will be possible for those elements where counting statistics are not a limiting factor. These measurements will make it possible to relate Eros to known classes of meteorites and reveal geological processes that occurred on Eros. The calibration measurements and analysis procedures presented here are necessary for the reduction and analysis of the X-ray data to be collected during one year of orbital operations at Eros.

Original languageEnglish (US)
Pages (from-to)498-519
Number of pages22
JournalIcarus
Volume147
Issue number2
DOIs
StatePublished - Oct 2000

Fingerprint

spectrometer
spectrometers
calibration
rendezvous spacecraft
K lines
x rays
meteorites
asteroids
asteroid
meteorite
limiting factor
counting
spatial resolution
spacecraft
statistics
orbitals
energy
data analysis
analysis
geological process

Keywords

  • Asteroids
  • Instrumentation
  • NEAR
  • X-rays

ASJC Scopus subject areas

  • Space and Planetary Science
  • Astronomy and Astrophysics

Cite this

Starr, R., Clark, P. E., Murphy, M. E., Floyd, S. R., McClanahan, T. P., Nittler, L. R., ... McNutt, R. L. (2000). Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer. Icarus, 147(2), 498-519. https://doi.org/10.1006/icar.2000.6453

Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer. / Starr, R.; Clark, P. E.; Murphy, M. E.; Floyd, S. R.; McClanahan, T. P.; Nittler, L. R.; Trombka, J. I.; Evans, L. G.; Boynton, William V.; Bailey, S. H.; Bhangoo, J.; Mikheeva, I.; Brückner, J.; Squyres, S. W.; McCartney, E. M.; Goldsten, J. O.; McNutt, R. L.

In: Icarus, Vol. 147, No. 2, 10.2000, p. 498-519.

Research output: Contribution to journalArticle

Starr, R, Clark, PE, Murphy, ME, Floyd, SR, McClanahan, TP, Nittler, LR, Trombka, JI, Evans, LG, Boynton, WV, Bailey, SH, Bhangoo, J, Mikheeva, I, Brückner, J, Squyres, SW, McCartney, EM, Goldsten, JO & McNutt, RL 2000, 'Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer', Icarus, vol. 147, no. 2, pp. 498-519. https://doi.org/10.1006/icar.2000.6453
Starr R, Clark PE, Murphy ME, Floyd SR, McClanahan TP, Nittler LR et al. Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer. Icarus. 2000 Oct;147(2):498-519. https://doi.org/10.1006/icar.2000.6453
Starr, R. ; Clark, P. E. ; Murphy, M. E. ; Floyd, S. R. ; McClanahan, T. P. ; Nittler, L. R. ; Trombka, J. I. ; Evans, L. G. ; Boynton, William V. ; Bailey, S. H. ; Bhangoo, J. ; Mikheeva, I. ; Brückner, J. ; Squyres, S. W. ; McCartney, E. M. ; Goldsten, J. O. ; McNutt, R. L. / Instrument Calibrations and Data Analysis Procedures for the NEAR X-Ray Spectrometer. In: Icarus. 2000 ; Vol. 147, No. 2. pp. 498-519.
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