Instrumentation of the variable-angle magneto-optic ellipsometer and its application to M-O media and other non-magnetic alms

Andy F. Zhou, J. Kevin Erwin, M. Mansuripur

Research output: Contribution to journalConference article

Abstract

A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto-optical properties. The optical properties of several non-magnetic films are also measured.

Original languageEnglish (US)
Pages (from-to)264-286
Number of pages23
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1663
DOIs
StatePublished - Jan 1 1992
EventOptical Data Storage Topical Meeting 1992 - San Jose, United States
Duration: Feb 9 1992Feb 14 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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