Instrumentation of the variable-angle magneto-optic ellipsometer and its application to M-O media and other non-magnetic alms

Andy F. Zhou, J. Kevin Erwin, M. Mansuripur

Research output: Contribution to journalConference article

Abstract

A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto-optical properties. The optical properties of several non-magnetic films are also measured.

Original languageEnglish (US)
Pages (from-to)264-286
Number of pages23
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1663
DOIs
StatePublished - Jan 1 1992
EventOptical Data Storage Topical Meeting 1992 - San Jose, United States
Duration: Feb 9 1992Feb 14 1992

Fingerprint

Magneto-optics
Magnetooptical effects
ellipsometers
magneto-optics
Instrumentation
Optical Properties
Optical properties
Optical recording
optical properties
Angle
Random errors
random errors
Random Error
Systematic Error
Systematic errors
systematic errors
Tensors
Thin Films
Tensor
recording

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

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abstract = "A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto-optical properties. The optical properties of several non-magnetic films are also measured.",
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