Insulator-to-metal transition of gold films observed by interferometric picometrology

Xuefeng Wang, Ming Zhao, David D. Nolte

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We obtain the complex refractive index and dielectric properties of ultra-thin gold films as a continuous function of thickness from 0.2 nm to 10 nm using picometrology. The atom-to-bulk transition of gold is observed.

Original languageEnglish (US)
Title of host publication2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
StatePublished - Nov 16 2009
Event2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 - Baltimore, MD, United States
Duration: Jun 2 2009Jun 4 2009

Publication series

Name2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009

Other

Other2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
CountryUnited States
CityBaltimore, MD
Period6/2/096/4/09

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Wang, X., Zhao, M., & Nolte, D. D. (2009). Insulator-to-metal transition of gold films observed by interferometric picometrology. In 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 [5224373] (2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009).