Intercomparisons of reflectance measurements

P. Yvonne Barnes, Edward A. Early, B. Carol Johnson, James J. Butler, Carol J. Bruegge, Stuart Biggar, Paul R. Spyak, Milutin Pavlov

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

A comparison of spectral diffuse reflectance between different national standards laboratories is being planned under the direction of the Comité Consultatif de Photométrie et Radiométrie (CCPR). A similar comparison of bidirectional reflectance distribution factor among laboratories in the United States in support of optical remote sensing measurements is nearing completion. Since this comparison provides valuable lessons for the one organized by the CCPR, pertinent results and their implications are presented.

Original languageEnglish (US)
Pages (from-to)10-15
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3425
DOIs
StatePublished - Dec 1 1998
Externally publishedYes
EventOptical Diagnostic Methods for Inorganic Transmissive Materials - San Diego, CA, United States
Duration: Jul 20 1998Jul 21 1998

Keywords

  • Aluminum
  • Bidirectional reflectance distribution function
  • Comparison
  • Diffuse reflectance
  • Polytetrafluoroethylene
  • Reflectance
  • Reflectance factor
  • Spectralon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Barnes, P. Y., Early, E. A., Johnson, B. C., Butler, J. J., Bruegge, C. J., Biggar, S., Spyak, P. R., & Pavlov, M. (1998). Intercomparisons of reflectance measurements. Proceedings of SPIE - The International Society for Optical Engineering, 3425, 10-15. https://doi.org/10.1117/12.326663