Interface roughness: what is it and how is it measured

E. Chason, Charles M Falco, A. Ourmazd, E. F. Schubert, J. M. Slaughter, R. S. Williams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

A panel discussion on interface roughness was held at the Fall 1992 Materials Research Society meeting. We present a summary of the results presented by the invited speakers on the application and interpretation of X-ray reflectivity, atomic force microscopy (AFM), scanning tunneling microscopy (STM), photoluminescence and transmission electron microscopy. A transcript of the moderated discussion is provided in the final section.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
EditorsHarry A. Atwater, Eric Chason, Marcia H. Grabow, Max G. Lagally
PublisherPubl by Materials Research Society
Pages203-239
Number of pages37
Volume280
ISBN (Print)1558991751
StatePublished - 1993
Externally publishedYes
EventProceedings of the 1992 Fall Meeting of the Materials Research Society - Boston, MA, USA
Duration: Nov 30 1992Dec 4 1992

Other

OtherProceedings of the 1992 Fall Meeting of the Materials Research Society
CityBoston, MA, USA
Period11/30/9212/4/92

Fingerprint

Scanning tunneling microscopy
Atomic force microscopy
Photoluminescence
Surface roughness
Transmission electron microscopy
X rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Chason, E., Falco, C. M., Ourmazd, A., Schubert, E. F., Slaughter, J. M., & Williams, R. S. (1993). Interface roughness: what is it and how is it measured. In H. A. Atwater, E. Chason, M. H. Grabow, & M. G. Lagally (Eds.), Materials Research Society Symposium Proceedings (Vol. 280, pp. 203-239). Publ by Materials Research Society.

Interface roughness : what is it and how is it measured. / Chason, E.; Falco, Charles M; Ourmazd, A.; Schubert, E. F.; Slaughter, J. M.; Williams, R. S.

Materials Research Society Symposium Proceedings. ed. / Harry A. Atwater; Eric Chason; Marcia H. Grabow; Max G. Lagally. Vol. 280 Publ by Materials Research Society, 1993. p. 203-239.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chason, E, Falco, CM, Ourmazd, A, Schubert, EF, Slaughter, JM & Williams, RS 1993, Interface roughness: what is it and how is it measured. in HA Atwater, E Chason, MH Grabow & MG Lagally (eds), Materials Research Society Symposium Proceedings. vol. 280, Publ by Materials Research Society, pp. 203-239, Proceedings of the 1992 Fall Meeting of the Materials Research Society, Boston, MA, USA, 11/30/92.
Chason E, Falco CM, Ourmazd A, Schubert EF, Slaughter JM, Williams RS. Interface roughness: what is it and how is it measured. In Atwater HA, Chason E, Grabow MH, Lagally MG, editors, Materials Research Society Symposium Proceedings. Vol. 280. Publ by Materials Research Society. 1993. p. 203-239
Chason, E. ; Falco, Charles M ; Ourmazd, A. ; Schubert, E. F. ; Slaughter, J. M. ; Williams, R. S. / Interface roughness : what is it and how is it measured. Materials Research Society Symposium Proceedings. editor / Harry A. Atwater ; Eric Chason ; Marcia H. Grabow ; Max G. Lagally. Vol. 280 Publ by Materials Research Society, 1993. pp. 203-239
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