Interface roughness:what is it and how is it measured

E. Chason, Charles M. Falco, A. Ourmazd, E. F. Schubert, J. M. Slaughter, R. S. Williams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

A panel discussion on interface roughness was held at the Fall 1992 Materials Research Society meeting. We present a summary of the results presented by the invited speakers on the application and interpretation of X-ray reflectivity, atomic force microscopy (AFM), scanning tunneling microscopy (STM), photoluminescence and transmission electron microscopy. A transcript of the moderated discussion is provided in the final section.

Original languageEnglish (US)
Title of host publicationEvolution of Surface and Thin Film Microstructure
EditorsHarry A. Atwater, Eric Chason, Marcia H. Grabow, Max G. Lagally
PublisherPubl by Materials Research Society
Pages203-239
Number of pages37
ISBN (Print)1558991751
StatePublished - Dec 1 1993
EventProceedings of the 1992 Fall Meeting of the Materials Research Society - Boston, MA, USA
Duration: Nov 30 1992Dec 4 1992

Publication series

NameMaterials Research Society Symposium Proceedings
Volume280
ISSN (Print)0272-9172

Other

OtherProceedings of the 1992 Fall Meeting of the Materials Research Society
CityBoston, MA, USA
Period11/30/9212/4/92

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Chason, E., Falco, C. M., Ourmazd, A., Schubert, E. F., Slaughter, J. M., & Williams, R. S. (1993). Interface roughness:what is it and how is it measured. In H. A. Atwater, E. Chason, M. H. Grabow, & M. G. Lagally (Eds.), Evolution of Surface and Thin Film Microstructure (pp. 203-239). (Materials Research Society Symposium Proceedings; Vol. 280). Publ by Materials Research Society.