Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron

G. A.N. Connell, R. Allen, M. Mansuripur

Research output: Contribution to journalArticle

7 Scopus citations


A new method of obtaining polar Kerr spectra from very thin absorbing films is used to study the thickness dependence of the Curie temperature, compensation temperature and critical behavior of the Fe-subnetwork of amorphous Tb-Fe alloy films. Significant deviations from bulk behavior begin to occur a thickness below about 20 nm.

Original languageEnglish (US)
Pages (from-to)337-339
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
StatePublished - Mar 1983
Externally publishedYes


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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