Interferometer errors due to the presence of fringes

Andrew E. Lowman, John E. Greivenkamp

Research output: Contribution to specialist publicationArticle

1 Scopus citations

Abstract

Phase-shifting interferometry permits analysis of complex interferograms. However, the measurement accuracy is reduced as the number of fringes is increased. The wavefront from a defocused spherical surface is used to demonstrate this degradation for several different transmission reference objectives.

Original languageEnglish (US)
PagesXIII-XIV
Volume7
No5
Specialist publicationOptics and Photonics News
StatePublished - May 1996

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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