Interferometer-induced wavefront errors when testing in a nonnull configuration

Andrew E. Lowman, John E. Greivenkamp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

Sub-Nyquist interferometry and other extended range techniques have the potential to allow measurement of aspheric surfaces with large departures from a reference sphere. The optic is tested in a non-null configuration, and aberrations are introduced into the wavefront by the interferometer optics. Consequently, the wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. The aberrations produced by a Twyman-Green interferometer for this application were examined. To study the severity of these interferometer induced errors, a defocused spherical surface was used to generate a non-null configuration. With wavefront departures up to 400 waves, errors up to 12 waves rms were found to be introduced by the non-null test setup.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRyszard J. Pryputniewicz, Gordon M. Brown, Werner P. Juptner
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages173-181
Number of pages9
ISBN (Print)0819412538
StatePublished - Dec 1 1994
EventInterferometry VI: Applications - San Diego, CA, USA
Duration: Jul 14 1993Jul 15 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2004
ISSN (Print)0277-786X

Other

OtherInterferometry VI: Applications
CitySan Diego, CA, USA
Period7/14/937/15/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Interferometer-induced wavefront errors when testing in a nonnull configuration'. Together they form a unique fingerprint.

  • Cite this

    Lowman, A. E., & Greivenkamp, J. E. (1994). Interferometer-induced wavefront errors when testing in a nonnull configuration. In R. J. Pryputniewicz, G. M. Brown, & W. P. Juptner (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 173-181). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2004). Publ by Society of Photo-Optical Instrumentation Engineers.