Interferometer-induced wavefront errors when testing in a nonnull configuration

Andrew E. Lowman, John E Greivenkamp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Citations (Scopus)

Abstract

Sub-Nyquist interferometry and other extended range techniques have the potential to allow measurement of aspheric surfaces with large departures from a reference sphere. The optic is tested in a non-null configuration, and aberrations are introduced into the wavefront by the interferometer optics. Consequently, the wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. The aberrations produced by a Twyman-Green interferometer for this application were examined. To study the severity of these interferometer induced errors, a defocused spherical surface was used to generate a non-null configuration. With wavefront departures up to 400 waves, errors up to 12 waves rms were found to be introduced by the non-null test setup.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRyszard J. Pryputniewicz, Gordon M. Brown, Werner P. Juptner
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages173-181
Number of pages9
Volume2004
ISBN (Print)0819412538
StatePublished - 1994
EventInterferometry VI: Applications - San Diego, CA, USA
Duration: Jul 14 1993Jul 15 1993

Other

OtherInterferometry VI: Applications
CitySan Diego, CA, USA
Period7/14/937/15/93

Fingerprint

Wavefronts
Interferometers
interferometers
Testing
configurations
Aberrations
aberration
Optics
optics
aspheric optics
Interferometry
interferometry
sensors
Sensors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Lowman, A. E., & Greivenkamp, J. E. (1994). Interferometer-induced wavefront errors when testing in a nonnull configuration. In R. J. Pryputniewicz, G. M. Brown, & W. P. Juptner (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2004, pp. 173-181). Publ by Society of Photo-Optical Instrumentation Engineers.

Interferometer-induced wavefront errors when testing in a nonnull configuration. / Lowman, Andrew E.; Greivenkamp, John E.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. Juptner. Vol. 2004 Publ by Society of Photo-Optical Instrumentation Engineers, 1994. p. 173-181.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lowman, AE & Greivenkamp, JE 1994, Interferometer-induced wavefront errors when testing in a nonnull configuration. in RJ Pryputniewicz, GM Brown & WP Juptner (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2004, Publ by Society of Photo-Optical Instrumentation Engineers, pp. 173-181, Interferometry VI: Applications, San Diego, CA, USA, 7/14/93.
Lowman AE, Greivenkamp JE. Interferometer-induced wavefront errors when testing in a nonnull configuration. In Pryputniewicz RJ, Brown GM, Juptner WP, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2004. Publ by Society of Photo-Optical Instrumentation Engineers. 1994. p. 173-181
Lowman, Andrew E. ; Greivenkamp, John E. / Interferometer-induced wavefront errors when testing in a nonnull configuration. Proceedings of SPIE - The International Society for Optical Engineering. editor / Ryszard J. Pryputniewicz ; Gordon M. Brown ; Werner P. Juptner. Vol. 2004 Publ by Society of Photo-Optical Instrumentation Engineers, 1994. pp. 173-181
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