Interferometric measurements at Eastman Kodak company

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This review paper discusses interferometric applications and developments within Eastman Kodak Company. Four different areas are examined. The first is the testing of mass-produced lenses, particularly molded glass lenses. Specific attention is given to testing of aspheric surfaces. The second general area is the measurement of large optics. An example is the method used to test large mirrors, such as that produced for the Space Telescope program. The third area deals with other uses of interferometry within Kodak. Many of these applications look at surfaces that are not optical surfaces in the traditional sense. The final portion of this paper examines current research and development activities in interferometry. A major need is to test aspheric surfaces that have large departures from a best-fit reference sphere. Progress in implementation of the new sub-Nyquist interferometry technique for extending the measurement range of existing interferometers is reviewed. An underlying theme of this paper is the general move towards aspherics throughout Kodak, with the accompanying need to test these surfaces quickly and easily.

Original languageEnglish (US)
Pages (from-to)212-227
Number of pages16
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume816
DOIs
StatePublished - Mar 23 1987
Externally publishedYes

Fingerprint

Interferometry
Aspheric Surface
Lens
interferometry
Industry
Space Telescope
Testing
Lenses
Interferometer
Research and Development
lenses
Optics
Mirror
Space telescopes
rangefinding
research and development
Interferometers
Range of data
interferometers
telescopes

ASJC Scopus subject areas

  • Applied Mathematics
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Interferometric measurements at Eastman Kodak company. / Greivenkamp, John E.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 816, 23.03.1987, p. 212-227.

Research output: Contribution to journalArticle

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