Interferometric metrology of conformal domes

Scott A. Lerner, Jose M Sasian, John E Greivenkamp, Robert O. Gappinger, Steve R. Clark

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

This work demonstrates how optical metrology of conformal domes can be accomplished by extending current aspheric testing techniques. Both transmitted wavefront testing of sub-apertures and full aperture null testing show feasibility.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages221-226
Number of pages6
Volume3705
Publication statusPublished - 1999
EventProceedings of the 1999 Window and Dome Technologies and Materials VI - Orlando, FL, USA
Duration: Apr 5 1999Apr 6 1999

Other

OtherProceedings of the 1999 Window and Dome Technologies and Materials VI
CityOrlando, FL, USA
Period4/5/994/6/99

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Lerner, S. A., Sasian, J. M., Greivenkamp, J. E., Gappinger, R. O., & Clark, S. R. (1999). Interferometric metrology of conformal domes. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3705, pp. 221-226). Society of Photo-Optical Instrumentation Engineers.