Interferometric metrology of conformal domes

Scott A. Lerner, Jose M. Sasian, John E. Greivenkamp, Robert O. Gappinger, Steve R. Clark

Research output: Contribution to journalConference articlepeer-review

11 Scopus citations

Abstract

This work demonstrates how optical metrology of conformal domes can be accomplished by extending current aspheric testing techniques. Both transmitted wavefront testing of sub-apertures and full aperture null testing show feasibility.

Original languageEnglish (US)
Pages (from-to)221-226
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3705
StatePublished - Dec 1 1999
EventProceedings of the 1999 Window and Dome Technologies and Materials VI - Orlando, FL, USA
Duration: Apr 5 1999Apr 6 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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