Interleaving and error correction in volume holographic memory systems

Wu Chun Chou, Mark A Neifeld

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

We study the use of error-correction coding (ECC) and two-dimensional interleaving for volume holographic memory (VHM) systems suffering from both random and systematic errors. The bit-error rate (BER) is used as the data-fidelity measure and as a design metric for optical 4f systems. The correlated error patterns arising from both lens aberrations and misalignment errors are analyzed, and we discuss the information theoretic storage capacity of VHM in the presence of such correlated error patterns. The performance of interleaving and ECC is analyzed from both BER and storage-capacity perspectives. Magnification, rotation, tilt, and defocus errors are also studied, and an experimental demonstration that combines ECC with two-dimensional interleaving is included.

Original languageEnglish (US)
Pages (from-to)6951-6968
Number of pages18
JournalApplied Optics
Volume37
Issue number29
StatePublished - 1998

Fingerprint

Error correction
Data storage equipment
Bit error rate
coding
Random errors
bit error rate
Systematic errors
Aberrations
Optical systems
Lenses
Demonstrations
random errors
magnification
systematic errors
misalignment
aberration
lenses

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Interleaving and error correction in volume holographic memory systems. / Chou, Wu Chun; Neifeld, Mark A.

In: Applied Optics, Vol. 37, No. 29, 1998, p. 6951-6968.

Research output: Contribution to journalArticle

@article{5329c34c29d049f3a6c36414f2072c20,
title = "Interleaving and error correction in volume holographic memory systems",
abstract = "We study the use of error-correction coding (ECC) and two-dimensional interleaving for volume holographic memory (VHM) systems suffering from both random and systematic errors. The bit-error rate (BER) is used as the data-fidelity measure and as a design metric for optical 4f systems. The correlated error patterns arising from both lens aberrations and misalignment errors are analyzed, and we discuss the information theoretic storage capacity of VHM in the presence of such correlated error patterns. The performance of interleaving and ECC is analyzed from both BER and storage-capacity perspectives. Magnification, rotation, tilt, and defocus errors are also studied, and an experimental demonstration that combines ECC with two-dimensional interleaving is included.",
author = "Chou, {Wu Chun} and Neifeld, {Mark A}",
year = "1998",
language = "English (US)",
volume = "37",
pages = "6951--6968",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "29",

}

TY - JOUR

T1 - Interleaving and error correction in volume holographic memory systems

AU - Chou, Wu Chun

AU - Neifeld, Mark A

PY - 1998

Y1 - 1998

N2 - We study the use of error-correction coding (ECC) and two-dimensional interleaving for volume holographic memory (VHM) systems suffering from both random and systematic errors. The bit-error rate (BER) is used as the data-fidelity measure and as a design metric for optical 4f systems. The correlated error patterns arising from both lens aberrations and misalignment errors are analyzed, and we discuss the information theoretic storage capacity of VHM in the presence of such correlated error patterns. The performance of interleaving and ECC is analyzed from both BER and storage-capacity perspectives. Magnification, rotation, tilt, and defocus errors are also studied, and an experimental demonstration that combines ECC with two-dimensional interleaving is included.

AB - We study the use of error-correction coding (ECC) and two-dimensional interleaving for volume holographic memory (VHM) systems suffering from both random and systematic errors. The bit-error rate (BER) is used as the data-fidelity measure and as a design metric for optical 4f systems. The correlated error patterns arising from both lens aberrations and misalignment errors are analyzed, and we discuss the information theoretic storage capacity of VHM in the presence of such correlated error patterns. The performance of interleaving and ECC is analyzed from both BER and storage-capacity perspectives. Magnification, rotation, tilt, and defocus errors are also studied, and an experimental demonstration that combines ECC with two-dimensional interleaving is included.

UR - http://www.scopus.com/inward/record.url?scp=0032505421&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032505421&partnerID=8YFLogxK

M3 - Article

C2 - 18301514

AN - SCOPUS:0032505421

VL - 37

SP - 6951

EP - 6968

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 29

ER -