Abstract
The properties of grain boundaries at microwave-frequencies in the high-TC materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain-boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2804-2807 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 11 |
| Issue number | 1 III |
| DOIs | |
| State | Published - Mar 2001 |
| Externally published | Yes |
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Keywords
- Grain boundaries
- Nonlinear surface impedance
- Vortex dynamics
- Y-Ba-Cu-O thin films
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)
Cite this
Intermodulation distortion and Josephson vortices in YBCO bicrystal grain boundaries. / Oates, Daniel E.; Xin, Hao; Dresselhaus, Gene; Dresselhaus, Mildred S.
In: IEEE Transactions on Applied Superconductivity, Vol. 11, No. 1 III, 03.2001, p. 2804-2807.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Intermodulation distortion and Josephson vortices in YBCO bicrystal grain boundaries
AU - Oates, Daniel E.
AU - Xin, Hao
AU - Dresselhaus, Gene
AU - Dresselhaus, Mildred S.
PY - 2001/3
Y1 - 2001/3
N2 - The properties of grain boundaries at microwave-frequencies in the high-TC materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain-boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field.
AB - The properties of grain boundaries at microwave-frequencies in the high-TC materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain-boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field.
KW - Grain boundaries
KW - Nonlinear surface impedance
KW - Vortex dynamics
KW - Y-Ba-Cu-O thin films
UR - http://www.scopus.com/inward/record.url?scp=0035268705&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035268705&partnerID=8YFLogxK
U2 - 10.1109/77.919646
DO - 10.1109/77.919646
M3 - Article
AN - SCOPUS:0035268705
VL - 11
SP - 2804
EP - 2807
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
SN - 1051-8223
IS - 1 III
ER -