TY - JOUR
T1 - Intermodulation distortion and Josephson vortices in YBCO bicrystal grain boundaries
AU - Oates, Daniel E.
AU - Xin, Hao
AU - Dresselhaus, Gene
AU - Dresselhaus, Mildred S.
N1 - Funding Information:
Manuscript received September 18, 2000. This work was supported by the Air Force Office of Scientific Research D. E Oates is with the M F Lincoln Laboratory, Lexington, MA and M F Physics Dept. Cambridge MA, e-mail: oates@ll.mit.edu H. Xin is with the MIT Phvsics Deut. Cambridge MA. AFRL Hanscom AFB MA, and MIT Lincoln Laborator;, Lexington,"MA. G. Dresselhaus is with AFRL Hanscom AFB MA and the Frances Bitter Magnet Laboratory, Cambridge MA. M. S. Dresselhaus is with the MIT Physics Dept. Cambridge MA.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2001/3
Y1 - 2001/3
N2 - The properties of grain boundaries at microwave-frequencies in the high-TC materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain-boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field.
AB - The properties of grain boundaries at microwave-frequencies in the high-TC materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain-boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field.
KW - Grain boundaries
KW - Nonlinear surface impedance
KW - Vortex dynamics
KW - Y-Ba-Cu-O thin films
UR - http://www.scopus.com/inward/record.url?scp=0035268705&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035268705&partnerID=8YFLogxK
U2 - 10.1109/77.919646
DO - 10.1109/77.919646
M3 - Conference article
AN - SCOPUS:0035268705
VL - 11
SP - 2804
EP - 2807
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
SN - 1051-8223
IS - 1 III
T2 - 2000 Applied Superconductivity Conference
Y2 - 17 September 2000 through 22 September 2000
ER -