Investigation of sources of metallic contamination by TXRF

S. Verhaverbeke, C. Werkhoven, M. Meuris, H. F. Schmidt, K. Dillenbeck, P. Mertens, M. Heyns, Ara Philipossian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this work we show a number of different applications for the use of TXRF to investigate metallic impurity sources. At first, we show that TXRF is well suited to measure metallic impurities in liquids which can be dried on a Si wafer. Then we show the measurement of the leaching of metallic impurities from polymers. Finally, by using a scrubber, the metallic impurities in gases can be measured and the performance of filters can be investigated.

Original languageEnglish (US)
Title of host publicationProceedings, Annual Technical Meeting - Institute of Environmental Sciences
Editors Anon
PublisherPubl by Inst of Environmental Sciences
Pages423-431
Number of pages9
Volume1
ISBN (Print)1877862193
StatePublished - 1993
Externally publishedYes
EventProceedings of the 39th Annual Technical Meeting of Institute of Environmental Sciences - Las Vegas, NV, USA
Duration: May 2 1993May 7 1993

Other

OtherProceedings of the 39th Annual Technical Meeting of Institute of Environmental Sciences
CityLas Vegas, NV, USA
Period5/2/935/7/93

Fingerprint

Contamination
Impurities
Scrubbers
Leaching
Liquids
Polymers
Gases

ASJC Scopus subject areas

  • Environmental Engineering

Cite this

Verhaverbeke, S., Werkhoven, C., Meuris, M., Schmidt, H. F., Dillenbeck, K., Mertens, P., ... Philipossian, A. (1993). Investigation of sources of metallic contamination by TXRF. In Anon (Ed.), Proceedings, Annual Technical Meeting - Institute of Environmental Sciences (Vol. 1, pp. 423-431). Publ by Inst of Environmental Sciences.

Investigation of sources of metallic contamination by TXRF. / Verhaverbeke, S.; Werkhoven, C.; Meuris, M.; Schmidt, H. F.; Dillenbeck, K.; Mertens, P.; Heyns, M.; Philipossian, Ara.

Proceedings, Annual Technical Meeting - Institute of Environmental Sciences. ed. / Anon. Vol. 1 Publ by Inst of Environmental Sciences, 1993. p. 423-431.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Verhaverbeke, S, Werkhoven, C, Meuris, M, Schmidt, HF, Dillenbeck, K, Mertens, P, Heyns, M & Philipossian, A 1993, Investigation of sources of metallic contamination by TXRF. in Anon (ed.), Proceedings, Annual Technical Meeting - Institute of Environmental Sciences. vol. 1, Publ by Inst of Environmental Sciences, pp. 423-431, Proceedings of the 39th Annual Technical Meeting of Institute of Environmental Sciences, Las Vegas, NV, USA, 5/2/93.
Verhaverbeke S, Werkhoven C, Meuris M, Schmidt HF, Dillenbeck K, Mertens P et al. Investigation of sources of metallic contamination by TXRF. In Anon, editor, Proceedings, Annual Technical Meeting - Institute of Environmental Sciences. Vol. 1. Publ by Inst of Environmental Sciences. 1993. p. 423-431
Verhaverbeke, S. ; Werkhoven, C. ; Meuris, M. ; Schmidt, H. F. ; Dillenbeck, K. ; Mertens, P. ; Heyns, M. ; Philipossian, Ara. / Investigation of sources of metallic contamination by TXRF. Proceedings, Annual Technical Meeting - Institute of Environmental Sciences. editor / Anon. Vol. 1 Publ by Inst of Environmental Sciences, 1993. pp. 423-431
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