Ionoluminescence decay measured with single ions

F. D. McDaniel, B. L. Doyle, C. H. Seager, D. S. Walsh, G. Vizkelethy, D. K. Brice, C. Yang, P. Rossi, M. Nigam, M. El Bouanani, G. V. Ravi Prasad, J. C. Schwartz, L. T. Mitchell, J. L. Duggan

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

A new ion beam analysis-based, single ion technique called the time to first photon has been developed to measure the decay of the luminescence signal of phosphors. Such measurements are currently needed to study luminescence decay mechanisms following high-density excitations and to identify strongly luminescent phosphor coatings with short lifetimes for ion photon emission microscopy (IPEM). The samples for this technique consist of thin phosphor layers placed or coated on the surface of PIN diodes. Single ions from an accelerator strike this sample and simultaneously create ion beam induced luminescence (IBIL) from the phosphor that is measured by a single-photon-detector, and an ion beam induced charge collection (IBICC) signal in the PIN diode. In this case, the IBICC signal provides the start pulse and the IBIL signal the stop pulse to a time to amplitude converter. It is straightforward to show that this approach also measures a signal proportional to activity versus time with an accuracy of 5% as long as the number of detected photons per ion is less than 0.1, which usually requires the use of absorbers for the IBIL detector or electronic discrimination for the IBIL signals. Details of the new analysis are given together with examples of luminescence decay measurements of several ceramic phosphors being considered to coat IPEM samples. IPEM is currently being developed at Sandia National Laboratory (SNL), the University of North Texas in Denton, and the Universities and INFN of Padova and Torino.

Original languageEnglish (US)
Pages (from-to)1-10
Number of pages10
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume190
Issue number1-4
DOIs
StatePublished - May 2002
Externally publishedYes

Keywords

  • Ion beam induced charge collection
  • Ion beam induced luminescence
  • Ion photon emission microscope
  • Ionoluminescence
  • Luminescence
  • Nuclear microprobe analysis
  • Phosphors
  • Scanning nuclear microprobe

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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