Laboratory testing of a Phase-Induced Amplitude Apodization (PIAA) coronagraph

Brian Kern, Olivier Guyon, Amir Give'on, Andreas Kuhnert, Albert Niessner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

We present high-contrast images from laboratory testing of a Phase Induced Amplitude Apodization (PIAA) coronagraph at NASA's High Contrast Imaging Testbed (HCIT). Using a deformable mirror and wavefront estimation and control algorithms, we create a "dark hole" in the monochromatic point-spread function with an inner working angle of 2.05 fλ/D, with a mean intensity 3.5×10-8. We discuss the contributions to this floor, and the techniques being developed to improve it. We also present simulations that investigate the effect of Lyot stops of various sizes, and conclude that a Lyot stop is necessary for 10-9 performance but that an annular postapodizer is not necessary.

Original languageEnglish (US)
Title of host publicationTechniques and Instrumentation for Detection of Exoplanets V
DOIs
StatePublished - Oct 11 2011
EventTechniques and Instrumentation for Detection of Exoplanets V - San Diego, CA, United States
Duration: Aug 23 2011Aug 24 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8151
ISSN (Print)0277-786X

Other

OtherTechniques and Instrumentation for Detection of Exoplanets V
CountryUnited States
CitySan Diego, CA
Period8/23/118/24/11

Keywords

  • Exoplanets
  • coronagraphy
  • deformable mirror
  • wavefront control
  • wavefront estimation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kern, B., Guyon, O., Give'on, A., Kuhnert, A., & Niessner, A. (2011). Laboratory testing of a Phase-Induced Amplitude Apodization (PIAA) coronagraph. In Techniques and Instrumentation for Detection of Exoplanets V [815104] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8151). https://doi.org/10.1117/12.896467