Lateral resolution enhancement in confocal self-interference microscopy

Dongkyun Kang, Daegab Gweon

Research output: Contribution to journalConference article

Abstract

Lateral resolution enhancement in confocal self-interference microscopy (CSIM) is evaluated. CSIM, which uses the birefringence of the calcite plate to generate self-interference pattern, sharpens the central lobe of the effective spot. Numerical simulation results of two-dimensional imaging performances are presented. Two-point resolution of 149nm is achieved, which is enhanced by nearly 100% compared to that of confocal microscopy.

Original languageEnglish (US)
Article number32
Pages (from-to)152-163
Number of pages12
JournalProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume5701
DOIs
StatePublished - Jul 21 2005
Externally publishedYes
EventThree- Dimensional and Multidomensional Microscopy: Image Acquisition and Processing XII - San Jose, CA, United States
Duration: Jan 25 2005Jan 27 2005

Keywords

  • Birefringence
  • Confocal microscopy
  • Self-interference
  • Superresolution

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Atomic and Molecular Physics, and Optics
  • Radiology Nuclear Medicine and imaging

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