Limitations of self-phase-modulation-based tunable delay system for all-optical buffer design

Ravi Pant, Michael D. Stenner, Mark A Neifeld

Research output: Contribution to journalArticle

Abstract

The distortion, noise, and bit-delay performance of a self-phase- modulation-based tunable delay system are analyzed. The pulse amplification required for achieving large spectral broadening results in large amplifier noise. We quantify the resulting delay versus signal-to-noise ratio trade-off. We demonstrate that for high bit rates it is difficult to achieve both large bit delay and good data fidelity. We find that for a given bit rate, reducing the duty cycle improves the fractional bit delay. For a duty cycle of 16%, a maximum bit delay of 15 bits is achieved.

Original languageEnglish (US)
Pages (from-to)5051-5060
Number of pages10
JournalApplied Optics
Volume47
Issue number27
DOIs
StatePublished - Sep 20 2008

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Self phase modulation
phase modulation
buffers
cycles
Amplification
Signal to noise ratio
signal to noise ratios
amplifiers
pulses

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Limitations of self-phase-modulation-based tunable delay system for all-optical buffer design. / Pant, Ravi; Stenner, Michael D.; Neifeld, Mark A.

In: Applied Optics, Vol. 47, No. 27, 20.09.2008, p. 5051-5060.

Research output: Contribution to journalArticle

@article{d1044c56dd9e483998459655773f127a,
title = "Limitations of self-phase-modulation-based tunable delay system for all-optical buffer design",
abstract = "The distortion, noise, and bit-delay performance of a self-phase- modulation-based tunable delay system are analyzed. The pulse amplification required for achieving large spectral broadening results in large amplifier noise. We quantify the resulting delay versus signal-to-noise ratio trade-off. We demonstrate that for high bit rates it is difficult to achieve both large bit delay and good data fidelity. We find that for a given bit rate, reducing the duty cycle improves the fractional bit delay. For a duty cycle of 16{\%}, a maximum bit delay of 15 bits is achieved.",
author = "Ravi Pant and Stenner, {Michael D.} and Neifeld, {Mark A}",
year = "2008",
month = "9",
day = "20",
doi = "10.1364/AO.47.005051",
language = "English (US)",
volume = "47",
pages = "5051--5060",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "27",

}

TY - JOUR

T1 - Limitations of self-phase-modulation-based tunable delay system for all-optical buffer design

AU - Pant, Ravi

AU - Stenner, Michael D.

AU - Neifeld, Mark A

PY - 2008/9/20

Y1 - 2008/9/20

N2 - The distortion, noise, and bit-delay performance of a self-phase- modulation-based tunable delay system are analyzed. The pulse amplification required for achieving large spectral broadening results in large amplifier noise. We quantify the resulting delay versus signal-to-noise ratio trade-off. We demonstrate that for high bit rates it is difficult to achieve both large bit delay and good data fidelity. We find that for a given bit rate, reducing the duty cycle improves the fractional bit delay. For a duty cycle of 16%, a maximum bit delay of 15 bits is achieved.

AB - The distortion, noise, and bit-delay performance of a self-phase- modulation-based tunable delay system are analyzed. The pulse amplification required for achieving large spectral broadening results in large amplifier noise. We quantify the resulting delay versus signal-to-noise ratio trade-off. We demonstrate that for high bit rates it is difficult to achieve both large bit delay and good data fidelity. We find that for a given bit rate, reducing the duty cycle improves the fractional bit delay. For a duty cycle of 16%, a maximum bit delay of 15 bits is achieved.

UR - http://www.scopus.com/inward/record.url?scp=56849083658&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=56849083658&partnerID=8YFLogxK

U2 - 10.1364/AO.47.005051

DO - 10.1364/AO.47.005051

M3 - Article

C2 - 18806867

AN - SCOPUS:56849083658

VL - 47

SP - 5051

EP - 5060

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 27

ER -